Frequency dependence of ultrahigh dielectric constant of novel synthesized SnO2 nanoparticles thick films

Abstract In this work, the electric and dielectric properties of nanocrystalline SnO 2 thick films were studied using ac impedance spectroscopy under different conditions through capacitance–frequency measurements in frequency range from 1 Hz to 1 MHz and bias voltage range from 0 V to 2 V. Results showed that dielectric constant ( ɛ ′), dielectric loss ( ɛ ″), loss tangent (tan δ ), ac electrical conductivity ( σ ) and the electric modulus ( M ) are strongly frequency dependent. A decrease in frequency accompanied with an increase in ɛ ′ and ɛ ″ values. Whereas, ac electrical conductivity ( σ ), real ( M / ) and imaginary parts of electric modulus ( M // ) values are increased with frequency increasing. A comparative study showed that our prepared thick films have greater dielectric value than that of the reported data; hence can be used them as ultrahigh dielectric materials.