journal article·2006-12

The Electronic Properties of Nanomaterials Elucidated by Synchrotron Radiation–Based Spectroscopy

S. C. Ray, J. W. Chiou, W. F. Pong, M.-H. Tsai

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Abstract

The use of synchrotron radiation–based spectroscopy to investigate electronic and bonding structures of nanostructured materials is reviewed with focuses on the X-ray absorption spectroscopy (XAS), valence-band photoemission spectroscopy (VB-PES), and scanning photoelectron microscopy (SPEM) measurements. This review addresses the current status of synchrotron radiation–based nanoscale characterization of carbon-based and ZnO nanomaterials. Current research works that are relevant to this rapidly evolving experimental area and implications in nanoscience and nanotechnology are emphasized.
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Research context

OpenAlex topics: ZnO doping and properties · Electron and X-Ray Spectroscopy Techniques · Ga2O3 and related materials

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

a Department of Physics , Tamkang University , Tamsui , Taiwan , Republic of China

b Department of Physics , National Sun Yat-Sen University , Kaohsiung , Taiwan , Republic of China

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