journal article·2021-09-03Open access

Atomic layer deposition of transition metal films and nanostructures for electronic and catalytic applications

James W. Maina, Andrea Merenda, Matthieu Weber, Jennifer M. Pringle, Mikhael Bechelany, Lachlan Hyde, Ludovic F. Dumée

Abstract

Atomic layer deposition (ALD) has emerged as the technique of choice in the microelectronics industry, owing to its self-limiting nature, that allows conformal film deposition in highly confined spaces. However, while the ALD of metal oxide has developed dramatically over the past decade, ALD of pure metal, particularly the transition metals has been developing at a very slow pace. This article reviews the latest development in the ALD of pure transition metals and alloys, for electronic and catalytic applications. In particular, the article analyzes how different factors, such as the substrate properties, deposition conditions, precursor and co-reactant properties, influence the deposition of the metal films and nanostructures, as well as the emerging applications of the ALD derived transition metal nanostructures. The challenges facing the field are highlighted, and suggestions are made for future research directions.
Source: openalex_inverted_index · Quality: baseline

Research context

OpenAlex topics: Semiconductor materials and devices · Catalytic Processes in Materials Science · Electronic and Structural Properties of Oxides

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Geelong, Institute for Frontier Materials, Deakin University, Waurn Ponds, Victoria, Australia

Institut Européen des Membranes, IEM-UMR 5635 ENSCM, UM, CNRS, Université de Montpellier, Montpellier Cedex 5, France

Swinburne University of Technology, Victoria, Australia

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