journal article·2009-09

ToF-SIMS depth profile of the surface film on pure magnesium formed by immersion in pure water and the identification of magnesium hydride

Antoine Seyeux, Ming Liu, Patrik Schmutz, Guangling Song, Andrej Atrens, Philippe Marcus

Corrosion Science· Volume 51· Issue 9
Publisher page

Abstract

Time of Flight-Secondary Ion Mass Spectrometry (ToF-SIMS) was used to examine the film formed on pure magnesium by immersion for 2 min in ultra pure water. The ToF-SIMS data indicates that there is magnesium hydride within the surface film. The presence of MgH(2) is a result of the Mg corrosion mechanism. (C) 2009 Elsevier Ltd. All rights reserved.
Source: openaire · Quality: candidate unverified · Source record ↗

Research context

OpenAlex topics: Magnesium Alloys: Properties and Applications · Hydrogen Storage and Materials · Corrosion Behavior and Inhibition

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

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