Contents: Adv. Eng. Mater. 10∕2016
Source abstract
Abstract
Background image represents an electronic micrograph (SEM) of the titanium alloy powder (Ti-6Al-4V) studied. On bottom left the schemes of the different confi gurations used for SPS in situ determination of the creep law behavior of this material are shown. On bottom right is shown an image, taken during a creep test, of a die heated in the SPS. Further details can be found in the article by Claude Estourns and co-workers on page 1720.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Intermetallics and Advanced Alloy Properties · Shape Memory Alloy Transformations · Material Selection and Properties
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References
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