Electronic Speckle Pattern Interferometry for Micromechanical Measurements
Source abstract
Abstract
A new optical setup that could be used for the analysis of displacement (or strain) of objects with diffuse as well as mirror-like reflecting (specular) surfaces is presented here together with the algorithm of data analysis. Combination of these two new approaches allows to minimize the area of analysis and to extend the class of materials to which the Electronic Speckle Pattern Interferometry (ESPI) can be applied.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Optical measurement and interference techniques · Advanced Measurement and Metrology Techniques · Surface Roughness and Optical Measurements
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