DataVXAdvanced Engineering MaterialsPaper
journal article·2001-03

Application of Amorphous Silicon Thin‐Film Position‐Sensitive Detector to Optical Rules

R. Martins, P. Teodoro, F. Soares, I. Ferreira, N. Guimarães, E. Fortunato, J. Borges, G. José, A. Groth, L. Schultze, D. Berndt, F. Reichel, F. Stam

Advanced Engineering Materials· Volume 3· Issue 3
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Abstract

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Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Astronomical Observations and Instrumentation · Surface Roughness and Optical Measurements

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Affiliations

Department of Materials Science, CENIMAT, Faculty of Sciences and Technology, New University of Lisbon and CEMOP‐UNINOVA, 2825‐114 Caparica (Portugal)

Tekelec, Chão de Murches, 2750 Cascais (Portugal)

AEG KUW, Sickingenstrasse 54, D‐10553 Berlin (Germany)

FER BV, Elbstrasse 3‐5, D‐39104 Magdeburg (Germany)

IFF, Sandtorstrasse 22, D‐39106 Magdeburg (Germany)

JENOPTIK, D‐07739 Jena (Germany)

NMRC, Lee Maltings, Prospect Road, Cork (Ireland)

References

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