DataVXAdvanced Engineering MaterialsPaper
journal article·2025-02Open access

Impact of Sample Preparation Approach on Transmission Electron Microscopy Investigation of Sputtered AlNi Multilayers Used for Reactive Soldering

Juan Jesús Jiménez, Konrad Jaekel, Christoph Pauly, Christian Schäfer, Heike Bartsch, Frank Mücklich, Francisco Miguel Morales

Advanced Engineering Materials· Volume 27· Issue 3
Publisher pageOpen full text
Source abstract

Abstract

Sputtered AlNi Multilayers In article number 2302215, Juan Jesús Jiménez and co-workers show that preparation methods have crucial influence on transmission electron microscopy results when investigating the intermixing between Al and Ni in reactive multilayers. The comparison of three lamella preparation methods shows that Xe-based FIB leads to low contamination, although Ga-FIB is a good alternative. This outcome presents an important aspect for the investigation of self-sustaining reactions on nanostructures and rough surfaces.
Source: openalex_inverted_index · Quality: baseline

Research context

Nanomaterials

OpenAlex topics: Aluminum Alloy Microstructure Properties · Metal and Thin Film Mechanics · Aluminum Alloys Composites Properties

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

IMEYMAT: Institute of Research on Electron Microscopy and Materials University of Cádiz 11510 Puerto Real Spain

Department of Materials Science and Metallurgical Engineering Inorganic Chemistry Faculty of Sciences University of Cádiz 11510 Puerto Real Cádiz Spain

Electronics Technology Group Institute of Materials Science and Engineering Institute of Micro and Nanotechnology MacroNano TU Ilmenau Gustav‐Kirchhoff‐Str. 7 98693 Ilmenau Germany

Functional Materials Department Saarland University Campus D3.3 66123 Saarbrücken Germany

References

Reference metadata was not supplied for this record.