Automated Evaluation of Kikuchi Patterns by Means of Radon and Fast Fourier Transformation, and Verification by an Artificial Neural Network
Source abstract
Abstract
Automated crystal orientation measurement (ACOM) in the SEM by interpreting backscatter Kikuchi patterns (see Figure) has become a standard tool of quantitative texture analysis in materials science during the last decade. A Radon transformation of the diffraction pattern, in combination with a 1D fast Fourier transformation, enables the fast extraction of the positions of Kikuchi bands. The high‐frequency coefficients of the 1D FFT are used to define pattern quality as a measure of lattice imperfection and residual stress of the real crystal structure.
Source: crossref · Quality: baseline
Research context
OpenAlex topics: Microstructure and mechanical properties · X-ray Diffraction in Crystallography · Aluminum Alloy Microstructure Properties
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References (17)
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