Effect of Electromagnetic Stirring on Microstructure Evolution and Mechanical/Electrical Properties of Cu‐25%Ag Alloy Wires

Application of electromagnetic stirring (EMS) during solidification represents a promising approach to tailoring the microstructure and performance of high‐strength conductive alloys. In this study, the effects of EMS on the as‐cast microstructure, mechanical strength, and electrical conductivity of Cu‐25%Ag (wt%) alloy wires are systematically investigated. Experimental results demonstrate that EMS effectively refined the grain structure, transitioning columnar dendritic growth to equiaxed dendritic morphology. This microstructural modification led to a significant enhancement in mechanical properties, with the ultimate tensile strength increasing by ≈50 MPa compared to conventionally solidified wires. However, the electrical conductivity exhibited a marginal reduction of 2% International Annealed Copper Standard, attributed to intensified lattice scattering induced by grain boundary proliferation. The underlying mechanisms governing the strength‐conductivity trade‐off are elucidated through microstructural characterization and phase interaction analysis. These findings provide critical insights into optimizing electromagnetic processing parameters for balancing mechanical and electrical performance in Cu–Ag‐based conductor alloys.