journal article·2024-06Open access

Electrode Placement Optimization for Electrical Impedance Tomography Using Active Learning

Junhyeong Lee, Kyungseo Park, Kundo Park, Yongtae Kim, Jung Kim, Seunghwa Ryu

Advanced Engineering Materials· Volume 26· Issue 11

Abstract

Electrical impedance tomography (EIT) offers a versatile imaging modality with a multitude of applications, although it encounters accuracy limitations. Herein, a novel systematic framework is presented that integrates a neural network (NN), active learning, and transfer learning to optimize electrode placement, improving image reconstruction performance based on user‐defined metrics. Given the many‐to‐one mapping between electrode configuration and the performance metric, the approach utilizes a NN that predicts performance metrics from electrode placement input. To maintain NN's prediction accuracy for unseen electrode configurations, performance metrics are maximized while iteratively updating the NN via active learning during the optimization process. Transfer learning is employed to expedite optimization of electrode placements for time‐consuming iterative reconstruction techniques by fine‐tuning a NN initially trained on one‐step reconstruction data. The method is validated using two representative reconstruction methods: one‐step reconstruction with Newton's one‐step error reconstructor prior and the iterative total variation method. This research underscores the potential of the proposed framework in addressing EIT's inherent limitations and augmenting its performance across diverse applications and reconstruction methods. The framework could potentially contribute to the advancement of noninvasive medical imaging, structural health monitoring, strain sensing, robotics, and other fields that depend on EIT.
Source: crossref · Quality: baseline

Research context

OpenAlex topics: Electrical and Bioimpedance Tomography · Flow Measurement and Analysis · Non-Destructive Testing Techniques

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Department of Mechanical Engineering Korea Advanced Institute of Science and Technology (KAIST) 291 Daehak‐ro Yuseong‐gu Daejeon 34141 Republic of Korea

Department of Robotics and Mechatronics Engineering Daegu Gyeongbuk Institute of Science and Technology (DGIST) 333 Techno Jungang‐daero Hyeonpung‐eup Dalseong‐gun Daegu 42988 Republic of Korea

Funding

National Research Foundation of Korea

References (43)

Show source-provided references
1. 10.1080/030919002100005968710.1080/0309190021000059687 ↗
2. 10.1137/S003614459833361310.1137/S0036144598333613 ↗
3. 10.1177/147592171455414210.1177/1475921714554142 ↗
4. 10.1088/0964-1726/25/8/08501610.1088/0964-1726/25/8/085016 ↗
5. H.Park H.Lee K.Park S.Mo J.Kim in2019 IEEE/RSJ Int. Conf. on Intelligent Robots and Systems (IROS) IEEE Macau2019.
6. 10.1126/scirobotics.abm718710.1126/scirobotics.abm7187 ↗
7. 10.1109/JSEN.2013.225345610.1109/JSEN.2013.2253456 ↗
8. 10.1088/0957-4484/18/31/31550110.1088/0957-4484/18/31/315501 ↗
9. 10.1088/0964-1726/23/4/04503410.1088/0964-1726/23/4/045034 ↗
10. 10.1177/1045389X0809605210.1177/1045389X08096052 ↗
11. 10.1016/j.ndteint.2014.07.00610.1016/j.ndteint.2014.07.006 ↗
12. 10.1016/j.ndteint.2018.06.00410.1016/j.ndteint.2018.06.004 ↗
13. 10.3390/s2102056410.3390/s21020564 ↗
14. 10.1088/1361-665X/ab874f10.1088/1361-665X/ab874f ↗
15. H.Hassan T.Tallman inSensors and Smart Structures Technologies for Civil Mechanical and Aerospace Systems 2020 SPIE CA United States2020.
16. 10.1109/TMECH.2021.306341410.1109/TMECH.2021.3063414 ↗
17. 10.1088/1361-6579/ab54eb10.1088/1361-6579/ab54eb ↗
18. 10.3390/s1709199910.3390/s17091999 ↗
19. 10.1109/TRO.2022.318680610.1109/TRO.2022.3186806 ↗
20. 10.1109/TIM.2020.297037110.1109/TIM.2020.2970371 ↗
21. 10.1016/j.cma.2020.11348910.1016/j.cma.2020.113489 ↗
22. 10.1088/1361-6501/aa743f10.1088/1361-6501/aa743f ↗
23. Zhao Z. · J. X‐Ray Sci. Technol. · 2014 · 22 · 797
24. 10.1515/BMT.2011.02210.1515/BMT.2011.022 ↗
25. A. K.Khambampati S. K.Konki Y.Han S.Sharma K. Y.Kim inTENCON 2018‐2018 IEEE Region 10 Conf. IEEE Jeju Island Korea2018.
26. J.Avery M.Runciman C.Fiani E. M.Sanchez S.Akhond Z.Liu K.Aristovich G.Mylonas in2022 IEEE/RSJ Int. Conf. on Intelligent Robots and Systems (IROS) IEEE Kyoto Japan2022.
27. 10.1109/TMI.2020.298305510.1109/TMI.2020.2983055 ↗
28. 10.1088/0967-3334/25/1/02110.1088/0967-3334/25/1/021 ↗
29. 10.1039/D3MH00039G10.1039/D3MH00039G ↗
30. 10.1038/s41524-021-00609-210.1038/s41524-021-00609-2 ↗
31. 10.1002/ima.185002020310.1002/ima.1850020203 ↗
32. 10.1109/TMI.2009.202254010.1109/TMI.2009.2022540 ↗
33. 10.1016/B978-012064155-0/50012-410.1016/B978-012064155-0/50012-4 ↗
34. 10.1088/0967-3334/27/5/S0310.1088/0967-3334/27/5/S03 ↗
35. 10.1080/17415977.2011.59852210.1080/17415977.2011.598522 ↗
36. 10.1137/23M156253610.1137/23M1562536 ↗
37. 10.1109/42.70074010.1109/42.700740 ↗
38. C.Xu X.Dong X.Shi F.Fu W.Shuai R.Liu F.You in2008 2nd Int. Conf. on Bioinformatics and Biomedical Engineering IEEE Sanghai China2008.
39. 10.1088/0967-3334/32/7/S0910.1088/0967-3334/32/7/S09 ↗
40. A.Hore D.Ziou in2010 20th Int. Conf. on Pattern Recognition IEEE Istanbul Turkey2010.
41. G.Martius C. H.Lampert in5th Int. Conf. Learn. Represent (ICLR) Toulon France2016.
42. 10.1109/37.15889810.1109/37.158898 ↗
43. 10.1016/j.nanoen.2022.10784610.1016/j.nanoen.2022.107846 ↗