journal article·2014-05Open access

The Stanford Nanocharacterization Laboratory (SNL) and Recent Applications of an Aberration‐Corrected Environmental Transmission Electron Microscope

Robert Sinclair, Paul Joseph Kempen, Richard Chin, Ai Leen Koh

Advanced Engineering Materials· Volume 16· Issue 5
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Abstract

This article describes the establishment, over a period of 10 years or so, of a multi‐user, institution‐wide facility for the characterization of materials and devices at the nanoscale. Emphasis is placed on the type of equipment that we have found to be most useful for our users, and the business strategy that maintains its operations. A central component of our facility is an aberration‐corrected environmental transmission electron microscope and its application is summarized in the studies of plasmon energies of silver nanoparticles, the band gap of PbS quantum dots, atomic site occupancy near grain boundaries in yttria stabilized zirconia, the lithiation of silicon nanoparticles, in situ observations on carbon nanotube oxidation and the electron tomography of varicella zoster virus nucleocapsids.
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Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Quantum Dots Synthesis And Properties · Advanced Electron Microscopy Techniques and Applications

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Affiliations

Department of Materials Science and Engineering Stanford University Durand Building Rm 113, 496 Lomita Mall Stanford CA 94305‐4034 USA

Department of Materials Science and Engineering Stanford University Durand Building 131, 496 Lomita Mall Stanford CA 94305‐4034 USA

Stanford Nano Shared Facilities McCullough Rm 225, 476 Lomita Mall Stanford CA 94305‐4045 USA

Stanford Nano Shared Facilities McCullough Rm. 236, 476 Lomita Mall Stanford CA 94305‐4045 USA

References (16)

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