Small‐Amplitude Atomic Force Microscopy

Abstract Small amplitude Atomic Force Microscopy (AFM) is a relatively new AFM technique which was specifically developed to perform linear measurements of nanomechanical phenomena. This is achieved by using ultra‐small cantilever amplitudes and very high sensitivity deflection sensors. Recently this technique has been used in ultra‐high vacuum (UHV) and liquid environments to measure atomic and molecular forces and dynamics with high precision. Here we focus on three examples which are interesting from a nanoengineering standpoint: Atomic energy dissipation (atomic friction), atomic‐scale contact mechanics, and nanotribology/molecular ordering in confined liquid films.