In Situ µLaue: Instrumental Setup for the Deformation of Micron Sized Samples
Source abstract
Abstract
Abstract µLaue diffraction sheds light onto the deformation behavior of miniaturized samples. Here we present a new instrumental setup for the in situ deformation of micron sized specimens at BM32 of the ESRF synchrotron source. Furthermore, a compression test of a 7 µm sized single slip oriented copper pillar is presented, showing the activation of an unpredicted slip system due to misalignment and the formation of several sub‐grains. The results of the compressed pillar as well as possibilities and crucial points for measuring and data evaluation are discussed.
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Research context
OpenAlex topics: Microstructure and mechanical properties · Force Microscopy Techniques and Applications · Metal and Thin Film Mechanics
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