journal article·2003-07-18

Analysis of Carbon Materials by X‐ray Photoelectron Spectroscopy and X‐ray Absorption Spectroscopy

I. Retzko, W.E.S. Unger

Advanced Engineering Materials· Volume 5· Issue 7
Publisher page

Abstract

Abstract Since hard coating such as ta:C films are of growing interest for protecting surfaces of industrial machines and high capacity tools against wear and friction or for biomedical applications, more information about the structure‐to‐property relation is required. Therefore, core level X‐ray photoelectron sprectroscopy and X‐ray absorption spectroscopy and spectromicroscopy are used to derive chemical information about selected carbon species.
Source: crossref · Quality: baseline

Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · X-ray Spectroscopy and Fluorescence Analysis · Metal and Thin Film Mechanics

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (12)

Show source-provided references
1. D. Briggs M. P. Seah (Eds.) Practical Surface Analysis vol. 1 2nd ed. Wiley Chichester1992.
2. Handbook of Surface and Interface Analysis(Eds: J. C. Riviere S. Myhra) Dekker New York1998.
3. J. Stöhr NEXAFS Spectroscopy vol. 25 of Springer Series in Surface Science Springer Berlin1992.10.1007/978-3-662-02853-7 ↗
4. 10.1103/PhysRevB.5.470910.1103/PhysRevB.5.4709 ↗
5. 10.1021/ac00238a00810.1021/ac00238a008 ↗
6. 10.1016/S0257-8972(99)00672-610.1016/S0257-8972(99)00672-6 ↗
7. I. Retzko D. Treu W. E. S. Unger H. Schulz H.‐J. Scheibe N. Matsubayashi inProc. Materials Week 2002 Werkstoffinformationsgesellschaft Frankfurt2002 ISBN 3‐88355‐314‐X (CD).
8. Tanuma S. · SIA J. · 1991 · 17 · 911
9. Kikuma J. · JESRP · 1998 · 88 · 919
10. 10.1063/1.12033910.1063/1.120339 ↗
11. A. P. Hitchcock T. Tyliszczak I. Koprinarov H. Stöver W. H. Li Y. M. Heng K. Murti P. Gerroir J. R. Dutcher K. Dalnoki‐Veress H. Ade inProc. 6th Int. Conf. X‐Ray Microscopy 2–6 June 1999 Berkeley AIP Conference Proceedings Melville NY USA2000 p. 231.
12. A. P. Hitchcock T. Tyliszczak Y. M. Heng R. Cornelius J. L. Brash H. Ade S. Anders A. Scholl F. Nolting inProc. 6th Int. Conf. X‐Ray Microscopy 2–6 June 1999 Berkeley AIP Conference Proceedings Melville NY USA2000 p. 235.