journal article·2001-08

On the Application of X-ray Microtomography in the Field of Materials Science

E. Maire, J. Y. Buffière, L. Salvo, J. J. Blandin, W. Ludwig, J. M. Létang

Advanced Engineering Materials· Volume 3· Issue 8
Publisher page

Abstract

The principle of the tomography technique and the different possible set-ups, which can be used to obtain medium-(10 μm) and high-(1 μm) resolution, three-dimensional, non-destructive images, are shown in this paper. Illustrations are made of the applications of the technique in the field of materials science. Examples are given for medium-resolution images of metallic foams and model metal matrix composites that are reinforced with spherical particles. High-resolution examples are shown for aluminium alloys. For low-absorbent materials we show that the phase contrast obtained using synchrotron radiation can provide a valuable solution. The quantitative use of these images, coupled with in-situ tensile tests or used for the simple analysis of the initial microstructure of several structural materials, is also described.
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Research context

OpenAlex topics: Microstructure and mechanical properties · Advanced X-ray Imaging Techniques · X-ray Diffraction in Crystallography

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