Electrochemical Stiffness Changes in Lithium Manganese Oxide Electrodes
Source abstract
Abstract
In situ strain and stress measurements are performed on composite electrodes to monitor potential‐dependent stiffness changes in lithium manganese oxide (LiMn2O4). Lithium insertion and removal results in asynchronous strain and stress generation in the electrode. Electrochemical stiffness changes are calculated by combining coordinated stress and strain measurements. The electrode experiences dramatic changes in electrochemical stiffness due to potential‐dependent Li+ ion intercalation mechanisms. The development of stress in the early stages of delithiation (at ≈3.95 V) due to a kinetic barrier at the electrode surface gives rise to stiffness changes in the electrode. Strain generation due to phase transformations reduces stiffness in the electrode at 4.17 V during delithiation and at 4.11 V during lithiation. During lithiation, stress generation due to Coulombic repulsions between occupied and incoming Li+ ions leads to stiffening of the electrode at 3.96 V. The electrode also experiences greater changes in stiffness during delithiation compared to lithiation. These changes in electrochemical stiffness provide insight into the interplay between mechanical and electrochemical properties which control electrode response to lithiation and delithiation.
Source: crossref · Quality: baseline
Research context
OpenAlex topics: Advancements in Battery Materials · Conducting polymers and applications · Advanced Sensor and Energy Harvesting Materials
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Materials Science and Engineering 210 Materials Science & Eng Bld, 1304 W. Green Urbana IL 61801 USA
Department of Chemistry University of Illinois A506 CLSL, Box 3‐6, 600 South Mathews Avenue Urbana IL 61801 USA
Funding
U.S. Department of Energy
References (78)
Show source-provided references
1. 10.1039/c0jm04225k10.1039/c0jm04225k ↗
2. 10.1039/c1ee01598b10.1039/c1ee01598b ↗
3. 10.1007/s11581-009-0373-x10.1007/s11581-009-0373-x ↗
4. 10.1038/ncomms343710.1038/ncomms3437 ↗
5. 10.1016/j.jpowsour.2006.10.02510.1016/j.jpowsour.2006.10.025 ↗
6. 10.1016/0167-2738(94)90450-210.1016/0167-2738(94)90450-2 ↗
7. 10.1038/ncomms669310.1038/ncomms6693 ↗
8. 10.1039/c0nr00939c10.1039/c0nr00939c ↗
9. 10.4028/www.scientific.net/AMR.391-392.106910.4028/www.scientific.net/AMR.391-392.1069 ↗
10. 10.1016/j.electacta.2005.11.01510.1016/j.electacta.2005.11.015 ↗
11. 10.1149/2.0241501jes10.1149/2.0241501jes ↗
12. 10.1002/aenm.20150064610.1002/aenm.201500646 ↗
13. 10.1021/cm901452z10.1021/cm901452z ↗
14. 10.1021/ja309143810.1021/ja3091438 ↗
15. 10.1149/2.003203jes10.1149/2.003203jes ↗
16. 10.1016/j.jpowsour.2004.06.05910.1016/j.jpowsour.2004.06.059 ↗
17. 10.1016/S0378-7753(00)00518-810.1016/S0378-7753(00)00518-8 ↗
18. 10.1016/0025-5408(83)90138-110.1016/0025-5408(83)90138-1 ↗
19. 10.1149/1.208655210.1149/1.2086552 ↗
20. 10.1149/1.209642110.1149/1.2096421 ↗
21. 10.1149/1.208601610.1149/1.2086016 ↗
22. 10.1016/0022-4596(87)90369-010.1016/0022-4596(87)90369-0 ↗
23. 10.1149/1.148152310.1149/1.1481523 ↗
24. 10.1149/1.139076810.1149/1.1390768 ↗
25. 10.1149/1.183828510.1149/1.1838285 ↗
26. 10.1149/2.0031411jes10.1149/2.0031411jes ↗
27. 10.1149/1.322274610.1149/1.3222746 ↗
28. 10.1557/JMR.2010.014210.1557/JMR.2010.0142 ↗
29. 10.1021/jp409032r10.1021/jp409032r ↗
30. 10.1063/1.349261710.1063/1.3492617 ↗
31. 10.1149/2.0201411jes10.1149/2.0201411jes ↗
32. 10.1149/1.346477310.1149/1.3464773 ↗
33. 10.1149/2.013302jes10.1149/2.013302jes ↗
34. 10.1002/aenm.20130001510.1002/aenm.201300015 ↗
35. 10.1149/1.155659610.1149/1.1556596 ↗
36. 10.1021/jp910915710.1021/jp9109157 ↗
37. 10.1149/1.136936510.1149/1.1369365 ↗
38. 10.1149/1.279906910.1149/1.2799069 ↗
39. 10.1149/1.138722410.1149/1.1387224 ↗
40. 10.1149/1.145971410.1149/1.1459714 ↗
41. 10.1149/1.139163110.1149/1.1391631 ↗
42. 10.1016/j.jpowsour.2007.11.03210.1016/j.jpowsour.2007.11.032 ↗
43. 10.1149/1.282674610.1149/1.2826746 ↗
44. 10.1002/aenm.20120002410.1002/aenm.201200024 ↗
45. 10.1557/mrs.2012.14410.1557/mrs.2012.144 ↗
46. 10.1002/aenm.20160009910.1002/aenm.201600099 ↗
47. 10.1007/s11340-014-9873-310.1007/s11340-014-9873-3 ↗
48. 10.1149/2.0091603jes10.1149/2.0091603jes ↗
49. 10.1149/1.337713010.1149/1.3377130 ↗
50. 10.1002/aenm.20150046610.1002/aenm.201500466 ↗
51. 10.1038/nmat470810.1038/nmat4708 ↗
52. 10.1002/aenm.20140031710.1002/aenm.201400317 ↗
53. 10.1149/2.068306jes10.1149/2.068306jes ↗
54. 10.1016/j.scriptamat.2014.08.01110.1016/j.scriptamat.2014.08.011 ↗
55. 10.1016/j.pmatsci.2014.02.00110.1016/j.pmatsci.2014.02.001 ↗
56. 10.1088/0957-0233/20/6/06200110.1088/0957-0233/20/6/062001 ↗
57. 10.1007/BF0232509210.1007/BF02325092 ↗
58. 10.1016/0262-8856(86)90057-010.1016/0262-8856(86)90057-0 ↗
59. 10.1016/S0079-6786(97)81003-510.1016/S0079-6786(97)81003-5 ↗
60. 10.1016/j.jpowsour.2004.06.05610.1016/j.jpowsour.2004.06.056 ↗
61. 10.1149/1.139335710.1149/1.1393357 ↗
62. Oh S. M. · J. Electrochem. Soc. · 2004 · 143 · 2204
63. 10.1016/j.matlet.2006.02.08910.1016/j.matlet.2006.02.089 ↗
64. 10.1149/1.218807110.1149/1.2188071 ↗
65. 10.1016/j.jpowsour.2014.05.03910.1016/j.jpowsour.2014.05.039 ↗
66. Cannarella J. · SPIE Sensing Technol. Appl. · 2014 · 9115 · 91150K
67. 10.1149/2.0361514jes10.1149/2.0361514jes ↗
68. 10.1007/s10008-012-1677-810.1007/s10008-012-1677-8 ↗
69. 10.1006/jssc.1996.010110.1006/jssc.1996.0101 ↗
70. 10.1021/cm201604g10.1021/cm201604g ↗
71. 10.1149/1.139348510.1149/1.1393485 ↗
72. 10.1149/2.045204jes10.1149/2.045204jes ↗
73. 10.1021/jp073292010.1021/jp0732920 ↗
74. 10.1021/jp971413y10.1021/jp971413y ↗
75. 10.1149/1.183613210.1149/1.1836132 ↗
76. 10.1149/1.345476210.1149/1.3454762 ↗
77. 10.1149/1.360187810.1149/1.3601878 ↗
78. 10.1021/la061032o10.1021/la061032o ↗