Deciphering the Benefits of Coordinated Binders in Si‐Based Anodes by Combined Operando/In Situ and Ex Situ X‐Ray Micro‐ and Nano‐Tomographies
Abstract
Research context
OpenAlex topics: Semiconductor materials and devices · Integrated Circuits and Semiconductor Failure Analysis · Electron and X-Ray Spectroscopy Techniques
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Affiliations
Université Grenoble Alpes CEA LITEN 17 rue des Martyrs Grenoble 38054 France
ESRF‐ The European Synchrotron Grenoble F‐38000 France
Institut des Matériaux Jean Rouxel (IMN) CNRS UMR 6502 Université de Nantes Cedex 3 Nantes F‐44322 France
Institut National de la Recherche Scientifique (INRS) Centre Énergie Matériaux, Télécommunications (EMT) 1650, boulevard Lionel Boulet Varennes QC J3X1P7 Canada
Swiss Light Source Paul Scherrer Institute Villigen 5232 Switzerland
INSA Lyon MATEIS CNRS UMR 5510 Villeurbanne F‐69621 France
Funding
HORIZON EUROPE European Institute of Innovation and Technology · Natural Sciences and Engineering Research Council of Canada