journal article·2001-07

Energy-filtered transmission electron microscopy in hard materials research

J. Zackrisson, A. Larsson

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Abstract

Abstract Energy-filtered transmission electron microscopy (EFTEM) offers the possibility of mapping elemental distributions at spatial resolutions down to the nanometre level for light as well as for heavy elements. In this paper, we demonstrate the power of EFTEM by presenting some examples from issues concerning hard materials for metal cutting applications. The combination of several elemental distribution images allows the chemical phase distribution to be determined, which is shown to be useful in the investigations of microstructural evolution during sintering and heat-treatment of cermets, worn cutting tools and hard coating microstructures. It is also shown how electron energy-loss near edge fine structure mapping can be used to separate different Al 2 O 3 phases in wear resistant coatings.
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