Determination of the residual stress depth profile of uniaxial compacted ruthenium powder samples by X-ray diffraction
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Abstract
Abstract Ruthenium samples with a cylindrical shape have been prepared by means of the Spark-Plasma-Sintering (SPS) process at sintering temperatures between 1200 °C and 1600 °C and a corresponding sintering time of 1 min. Similar samples were obtained by conventional hot-pressing process methods at 1200 °C and 1400 °C for 60 min. The residual stress components σ 11 and σ 33 directed parallel and vertical to the compaction axis have been determined on the plane terminal face of these samples by means of the grazing incidence sin 2 ψ method. The variation of the angle of incidence between 1° and 10° permitted diffraction measurements at a mean depth of X-ray penetration up to 0.6 μm. The depth profiles of the residual stress were subsequently deduced.
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