An AES–ELEED study of the Al/GaP(110) interface
Source abstract
Abstract
The Al/GaP(110) interface, formed by evaporating Al on a clean, well-ordered, sputter-annealed GaP(110) surface was studied with ELEED and AES. Evidence for island formation, when Al is evaporated on the room-temperature substrate, comes from the slow decrease of the Ga and P AES peaks and the persistence of the substrate ELEED pattern for up to 75 ML (monolayer) of Al. Limited substrate decomposition was also observed for higher rates of Al evaporation. Upon annealing at moderate temperature, Al undergoes a metal–cation replacement reaction whereby Al–P bonds are formed and metallic Ga appears at the surface of the system. With an initial Al coverage of more than 8 ML and a 690 °C annealing cycle, a few layers of AlP are formed.
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Research context
OpenAlex topics: Semiconductor materials and devices · GaN-based semiconductor devices and materials · Surface and Thin Film Phenomena
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Affiliations
Department of Electrical Engineering and Computer Science, Princeton University, Princeton, New Jersey 08544
References
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