Chloride Uptake by Oxide Covered Aluminum as Determined by X‐Ray Photoelectron and X‐Ray Absorption Spectroscopy
Source abstract
Abstract
The uptake of chloride by aluminum polarized at potentials below (less positive than) the pitting potential in 0.1 M NaCl solutions was studied using X‐ray photoelectron spectroscopy (XPS) and X‐ray absorption spectroscopy (XAS). The XPS chloride spectra showed that two distinct sets of doublets are present. One doublet is related to chloride on the surface and the second is related to chloride incorporated in the oxide film. In the case of XAS, deconvolution of the spectrum obtained for samples polarized below the pitting potential also showed the presence of chloride in the near surface region and in the oxide film. The important point of this work is that the observed chloride was present in two different chemical environments as determined with both XAS and XPS. © 1999 The Electrochemical Society. All rights reserved.
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Research context
OpenAlex topics: Semiconductor materials and devices · X-ray Diffraction in Crystallography · Electron and X-Ray Spectroscopy Techniques
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Affiliations
Naval Research Laboratory, Washington, District of Columbia 20375, United States of America
George Washington University, Washington, District of Columbia 20052, United States of America
North Carolina State University, Raleigh, North Carolina 27695, United States of America
Department of Chemistry, University of Southampton, Southampton, England
References
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