journal article·2012

Effect of Convection-Dependent Adsorption of Additives on Microvia Filling in an Acidic Copper Plating Solution

Su-Mei Huang, Cheng-Wei Liu, Wei-Ping Dow

Publisher page

Abstract

Microvia filling of a printed circuit board by acidic copper electroplating was performed to evaluate whether the filling performance of an acidic copper plating solution could be quantified and monitored. The acidic copper plating solution was composed of polyethylene glycol, chloride ions, bis(3-sulfopropyl) disulfide and Alcian Blue. The electrochemical methodology for quantifying the filling performance of the copper plating solution is based on the adsorption and mass transfer of chloride ions. The potential difference that was obtained from galvanostatic measurements at two different rotating speeds of a copper working electrode was confirmed to be an effective indicator of filling performance. A larger potential difference reflected better filling performance. The individual contribution of each additive in the potential difference was explored in detail. The leveler and chloride ion concentrations dominated the potential difference, i.e., the filling performance. When the potential difference was larger than a critical value, i.e., 11 mV, the filling performance was higher than 80%.
Source: openalex_inverted_index · Quality: baseline

Research context

OpenAlex topics: Electrodeposition and Electroless Coatings · Corrosion Behavior and Inhibition · Electronic Packaging and Soldering Technologies

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (44)

Show source-provided references
1. 10.1016/S0013-4686(01)00592-810.1016/S0013-4686(01)00592-8 ↗
2. 10.1109/MEI.2003.123871510.1109/MEI.2003.1238715 ↗
3. 10.1108/0305612031045494310.1108/03056120310454943 ↗
4. 10.1109/TADVP.2004.83189010.1109/TADVP.2004.831890 ↗
5. 10.1108/0305612081084876110.1108/03056120810848761 ↗
6. 10.1016/S0022-0728(03)00110-410.1016/S0022-0728(03)00110-4 ↗
7. 10.1149/1.157215410.1149/1.1572154 ↗
8. 10.1149/1.190167010.1149/1.1901670 ↗
9. 10.1149/1.216574310.1149/1.2165743 ↗
10. 10.1016/j.electacta.2007.12.04810.1016/j.electacta.2007.12.048 ↗
11. 10.1016/j.electacta.2009.05.05310.1016/j.electacta.2009.05.053 ↗
12. 10.1149/1.220504710.1149/1.2205047 ↗
13. 10.5104/jiep.8.31810.5104/jiep.8.318 ↗
14. 10.1149/1.326597110.1149/1.3265971 ↗
15. 10.1088/0960-1317/20/11/11502310.1088/0960-1317/20/11/115023 ↗
16. 10.1016/j.mee.2010.10.01810.1016/j.mee.2010.10.018 ↗
17. 10.1016/j.mee.2010.06.03010.1016/j.mee.2010.06.030 ↗
18. 10.1021/jp034875m10.1021/jp034875m ↗
19. 10.1147/rd.491.000310.1147/rd.491.0003 ↗
20. 10.1149/1.186767210.1149/1.1867672 ↗
21. 10.1149/1.187837210.1149/1.1878372 ↗
22. 10.1149/1.220699910.1149/1.2206999 ↗
23. 10.1149/1.233558710.1149/1.2335587 ↗
24. 10.1149/1.240105710.1149/1.2401057 ↗
25. 10.1149/1.271020010.1149/1.2710200 ↗
26. 10.1149/1.283490710.1149/1.2834907 ↗
27. 10.1016/j.electacta.2011.03.01510.1016/j.electacta.2011.03.015 ↗
28. 10.1016/S0927-7757(97)00315-410.1016/S0927-7757(97)00315-4 ↗
29. 10.1016/S0022-0728(99)00048-010.1016/S0022-0728(99)00048-0 ↗
30. 10.1021/jp003542b10.1021/jp003542b ↗
31. 10.1149/1.205201910.1149/1.2052019 ↗
32. Isono T. Tachibana S. Kawase T. Omura N. , U.S. Patent, US7220347B2 (2007).
33. Dow W.-P. Liu C.-W. , Taiwan Patent, I292295 (2008).
34. Ansar S. Chen Y.-S. Barkey D. P. Christian S. Toben M. , 214th ECS Meeting, Abstract # 2511, “Modeling of Copper Via Filling Behavior by Rotating Disk Amperometry,” F2 - Electronics Packaging 3, Electrodeposition, Honolulu, Hawaii, October 14 (2008).10.1149/MA2008-02/38/2511 ↗
35. Richardson T. B. Zhang Y. Wang C. Paneccasio V. Jr. Wang C. Lin X. Hurtubise R. Abys J. A. , U.S. Patent, US7670950B2 (2010).
36. 10.1149/2.076112jes10.1149/2.076112jes ↗
37. 10.1149/1.314727310.1149/1.3147273 ↗
38. Bard A. J. Faulkner L. R. , Electrochemical Methods, Fundamentals and Applications, 2nd ed., p. 137, John Wiley & Sons, Inc., New York (2001).
39. 10.1021/la061157t10.1021/la061157t ↗
40. 10.1149/1.271961110.1149/1.2719611 ↗
41. 10.1021/la802959810.1021/la8029598 ↗
42. 10.1021/la101430310.1021/la1014303 ↗
43. 10.1149/1.356047910.1149/1.3560479 ↗
44. 10.1021/la200219k10.1021/la200219k ↗