article·2002-01-01

Surface Kinetics of Oxygen Incorporation into SrTiO[sub 3]

M. Leonhardt, Roger A. De Souza, J. Claus, Joachim Maier

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Abstract

Effective surface rate constants for oxygen incorporation have been determined for single-crystal Fe-doped from chemical relaxation experiments, by in situ , spatially resolved optical absorption spectroscopy, and from tracer exchange experiments, by subsequent secondary ion mass spectrometry analysis. Experiments were carried out as a function of temperature, oxygen partial pressure, and dopant concentration. The effect of various metal films (Pt, Ag, Cr) and metal oxide films and on the surface reaction kinetics was also investigated. The implications of the results with regard to the mechanisms of chemical and tracer incorporation into are discussed. © 2002 The Electrochemical Society. All rights reserved.
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OpenAlex topics: Electronic and Structural Properties of Oxides · Semiconductor materials and devices · Ferroelectric and Piezoelectric Materials

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