journal article·1993-03-01

Valency and Structure of Iridium in Anodic Iridium Oxide Films

Martin Hüppauff, Bruno Lengeler

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Abstract

The valence of iridium in anodic iridium oxide films has been determined by x‐ray absorption spectroscopy and varies between 3.0 and 4.8 in a voltammogram cycle. When the valency starts to increase the first coordination shell around an iridium ion begins to shrink from 0.203 at to 0.191 nm at . At the same time a strong spread in the interatomic distances in this shell is observed. Our data give support to the model proposed by Kötz et al. for the charge exchange reaction during a voltammogram cycle.
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Research context

OpenAlex topics: Anodic Oxide Films and Nanostructures · Semiconductor materials and devices · Advanced Memory and Neural Computing

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Affiliations

Institut für Festkörperforschung, Forschungszentrum Jülich, D‐5170 Jülich, Germany

Institut für Schicht‐ und Ionentechnik, Forschungszentrum Jülich, D‐5170 Jülich, Germany

References

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