journal article·2019Open access

Electrochemical Stability of Fluorine Doped Tin Oxide (FTO) Coating at Different pH Conditions

Alen Korjenic, Krishnan S Raja

Abstract

Fluorine doped tin oxide coated glass slides were evaluated for their chemical stability in different pH solutions at room temperature by carrying out potentiodynamic polarization and cyclic voltammetry (CV). The FTO was more stable in 0.1 M HNO 3 and 0.1 M NaCl solutions under both anodic and cathodic polarization conditions. Cathodic polarization in 0.1 M HCl solution resulted in a reduction of SnO 2 to lower valent species. The semiconductivity of FTO, which was n-type at low anodic potentials, was p-type at high anodic potentials possibly due to the formation of a SnO-type surface layer by the removal of lattice oxygen during the oxygen evolution reaction. Cyclic stability of the FTO was evaluated by conducting CV between −2.0 and vbn 2.0 V Ag/AgCl at 1 V/s. Intergranular corrosion was observed and the stability was completely lost after 215 cycles in the 0.1 M HCl solution. The stability of FTO was better in the 0.1 M NaOH solution, wherein the electro-catalytic activity degraded after 500 cycles, the electrical connectivity was maintained even after 4500 cycles.
Source: openalex_inverted_index · Quality: baseline

Research context

OpenAlex topics: ZnO doping and properties · Gas Sensing Nanomaterials and Sensors · Electronic and Structural Properties of Oxides

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (74)

Show source-provided references
1. 10.1016/j.pmatsci.2014.06.00310.1016/j.pmatsci.2014.06.003 ↗
2. 10.1063/1.337440610.1063/1.3374406 ↗
3. 10.1016/S0038-1098(97)10151-X10.1016/S0038-1098(97)10151-X ↗
4. 10.1149/1.213309010.1149/1.2133090 ↗
5. 10.1063/1.36679610.1063/1.366796 ↗
6. Kasap S. O. , Principles of Electronic Materials and Devices, 2nd Edition, Tata McGraw-Hill, New Delhi, 396 (2002).
7. 10.1007/BF0035600910.1007/BF00356009 ↗
8. 10.1016/j.ssc.2009.01.01010.1016/j.ssc.2009.01.010 ↗
9. 10.1039/C2TC00400C10.1039/C2TC00400C ↗
10. 10.1016/j.apsusc.2004.11.07410.1016/j.apsusc.2004.11.074 ↗
11. 10.1063/1.166064810.1063/1.1660648 ↗
12. 10.1016/j.ssc.2009.01.01010.1016/j.ssc.2009.01.010 ↗
13. 10.1016/j.physb.2010.11.01510.1016/j.physb.2010.11.015 ↗
14. 10.1103/PhysRevB.81.24521610.1103/PhysRevB.81.245216 ↗
15. 10.1111/j.1551-2916.2011.04649.x10.1111/j.1551-2916.2011.04649.x ↗
16. 10.1103/PhysRevB.63.04511510.1103/PhysRevB.63.045115 ↗
17. 10.1149/1.183646310.1149/1.1836463 ↗
18. 10.1149/1.139170810.1149/1.1391708 ↗
19. 10.1016/j.jpowsour.2007.03.08610.1016/j.jpowsour.2007.03.086 ↗
20. 10.1016/j.apsusc.2013.02.08510.1016/j.apsusc.2013.02.085 ↗
21. 10.1016/0013-4686(80)80016-810.1016/0013-4686(80)80016-8 ↗
22. 10.1016/j.ceramint.2015.07.18910.1016/j.ceramint.2015.07.189 ↗
23. 10.1371/journal.pone.010794210.1371/journal.pone.0107942 ↗
24. 10.1149/1.241085110.1149/1.2410851 ↗
25. 10.1021/ac60368a03510.1021/ac60368a035 ↗
26. 10.1002/pssb.20104638410.1002/pssb.201046384 ↗
27. 10.1149/1.240731610.1149/1.2407316 ↗
28. 10.1016/S0013-4686(01)00873-810.1016/S0013-4686(01)00873-8 ↗
29. 10.1016/0013-4686(84)87028-010.1016/0013-4686(84)87028-0 ↗
30. 10.1038/srep1216710.1038/srep12167 ↗
31. Gileadi E. , Physical Electrochemistry: Fundamentals, Techniques, and Applications, Wiley-VCH, 78 (2011).
32. 10.1038/nchem.269510.1038/nchem.2695 ↗
33. 10.1021/ja301567f10.1021/ja301567f ↗
34. 10.1103/PhysRevLett.87.26610410.1103/PhysRevLett.87.266104 ↗
35. 10.1063/1.174261610.1063/1.1742616 ↗
36. 10.1021/j100238a04810.1021/j100238a048 ↗
37. 10.1038/srep1380110.1038/srep13801 ↗
38. 10.1021/jp508977j10.1021/jp508977j ↗
39. 10.1021/acsami.6b0610310.1021/acsami.6b06103 ↗
40. Pourbaix M. , Atlas of Ebxtrochemical Equilibria in Aqueous Solution, 2nd Ed., N.A.C.E., Houston, U.S.A. 476 (1974).
41. 10.1039/c3ra40416a10.1039/c3ra40416a ↗
42. 10.1038/s41598-017-04079-910.1038/s41598-017-04079-9 ↗
43. Orazem M. E. Tribollet B. , Electrochemical Impedance Spectroscopy, 1st edition, Wiley-Interscience, Hoboken, N.J, 309 (2008).10.1002/9780470381588 ↗
44. 10.1590/1980-5373-mr-2017-050210.1590/1980-5373-mr-2017-0502 ↗
45. 10.1016/j.mssp.2013.03.00910.1016/j.mssp.2013.03.009 ↗
46. Skoog D. A. , Principles of Instrumental Analysis, 3rd Ed., Saunders College Publishing, Ney York, 184 (1985).
47. 10.1021/jp050334g10.1021/jp050334g ↗
48. 10.1039/tf961570210410.1039/tf9615702104 ↗
49. 10.1149/1.198434810.1149/1.1984348 ↗
50. 10.1063/1.490954210.1063/1.4909542 ↗
51. Leng Y. , Materials Characterization: Introduction to Microscopic and Spectroscopic Methods, John Wiley & Sons (Asia) Pte Ltd., Singapore, 264 (2008).10.1002/9780470823002 ↗
52. 10.1088/0022-3719/4/15/02710.1088/0022-3719/4/15/027 ↗
53. 10.1103/PhysRevB.21.161710.1103/PhysRevB.21.1617 ↗
54. 10.1016/j.matchemphys.2014.08.05510.1016/j.matchemphys.2014.08.055 ↗
55. 10.1016/j.physe.2018.05.01610.1016/j.physe.2018.05.016 ↗
56. 10.1016/j.ssc.2011.03.02910.1016/j.ssc.2011.03.029 ↗
57. 10.1016/0040-6090(84)90303-110.1016/0040-6090(84)90303-1 ↗
58. 10.1016/j.apsusc.2015.04.08510.1016/j.apsusc.2015.04.085 ↗
59. 10.1103/PhysRevB.55.266610.1103/PhysRevB.55.2666 ↗
60. 10.1016/j.mssp.2018.09.00310.1016/j.mssp.2018.09.003 ↗
61. 10.1039/C5RA13043C10.1039/C5RA13043C ↗
62. 10.1016/S0013-4686(00)00660-510.1016/S0013-4686(00)00660-5 ↗
63. 10.1103/PhysRevMaterials.1.01460210.1103/PhysRevMaterials.1.014602 ↗
64. 10.1021/jp953720e10.1021/jp953720e ↗
65. Kasap S. O. , Principles of Electronic Materials And Devices, Tata Mcgraw-Hill Publishing Company Limited (2006).
66. 10.1016/j.ssc.2009.01.01010.1016/j.ssc.2009.01.010 ↗
67. 10.1021/ja01108a00310.1021/ja01108a003 ↗
68. 10.1021/ja026262d10.1021/ja026262d ↗
69. 10.1021/cm020973t10.1021/cm020973t ↗
70. 10.1016/j.jphotochem.2003.12.02810.1016/j.jphotochem.2003.12.028 ↗
71. 10.1016/0040-6090(83)90256-010.1016/0040-6090(83)90256-0 ↗
72. 10.1016/j.apsusc.2011.04.05510.1016/j.apsusc.2011.04.055 ↗
73. 10.1016/j.apsusc.2014.06.09210.1016/j.apsusc.2014.06.092 ↗
74. 10.1149/2.0171702jes10.1149/2.0171702jes ↗