A Comparison of the Oxidation Kinetics of SiC and Si3 N 4
Source abstract
Abstract
There is lingering disagreement over the relative oxidation kinetics of and in the regime of passive oxidation. Various oxidation enthalpies have been reported for these materials, in some cases with suggestions of an increase at higher temperatures. The result is uncertainty over the respective diffusion mechanisms that limit oxidation rates in these materials. It is suspected that this confusion may be due, in large part, to the effects of impurities from the oxidation environment. Accordingly, this study was aimed at clarifying some of the issues by undertaking the simultaneous oxidation of CVD and within a furnace tube of fused silica known to be very pure. We discuss the results obtained in the interval 1200 to 1500°C, and their implications on the respective rate‐limiting mechanisms.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Advanced ceramic materials synthesis · Semiconductor materials and devices · Silicon Carbide Semiconductor Technologies
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Affiliations
NYMA, NASA Lewis Research Center, Cleveland, Ohio 44135
Department of Chemical Engineering, Cleveland State University, Cleveland, Ohio 44115
References
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