A Point Defect Model for Anodic Passive Films: I . Film Growth Kinetics

A model based on the movement of point defects in an electrostatic field is proposed to interpret the growth behavior of a passive film on a metal surface. This model results in a logarithmic growth law. The theoretical equations derived from the model readily account for experimental data for the growth of a passive film on iron. It is found that the field strength of the film is . The dependence of film/solution interface potential difference on the applied potential (α) was found to be 0.743, and is independent of the identity of the anion in solution. However, the dependence of the potential difference across the film/solution interface on the solution p H (β) is strongly dependent on the identity of the solution anion.