Texture memory effect in heavily cold-rolled Ni3Al single crystals

Abstract In Ni 3 Al the cold-rolled Goss texture changed to a complicated one after primary recrystallization and returned to the original Goss during the subsequent grain growth, which can be referred to as the texture memory effect. In this study, we examined the evolution of grain orientations during the grain growth using the electron backscatter diffraction (EBSD) method. It was found that just after the primary recrystallization most of the grains had a 40°〈1 1 1〉 rotation relationship to the Goss texture, the remaining grains being Goss and other textures. The formation of the 40°〈1 1 1〉 rotated grains can be explained by a multiple twinning mechanism. In the grain growth, the Goss grains, which were surrounded by the 40°〈1 1 1〉 rotated grains, grew preferentially due to the high mobility of the 40°〈1 1 1〉 grain boundaries, leading to the texture memory effect.