Intergranular films at metal–ceramic interfacesPart II – calculation of Hamaker coefficients
Source abstract
Abstract
Abstract We report here theoretical calculations indicating the stability of equilibrium nanometer-thick films at metal–ceramic interfaces. Hamaker coefficients were calculated for metal–ceramic interfaces in the presence of a SiO2-based film, which indicated that a stronger attractive force is expected for intergranular films at metal–alumina interfaces, relative to alumina grain boundaries, correlating to the experimentally measured film thickness presented in part I of this report. From the combination of an attractive van der Waals force together with steric repulsion due to ordering induced in the amorphous film, a force balance can be obtained leading to the formation of equilibrated films at metal–ceramic interfaces.
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Research context
OpenAlex topics: Force Microscopy Techniques and Applications · Surface and Thin Film Phenomena · Ferroelectric and Piezoelectric Materials
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