journal article·2020-02

Effect of twin boundary formation on the growth rate of the GaSb{111} plane

Keiji Shiga, Kensaku Maeda, Haruhiko Morito, Kozo Fujiwara

Acta Materialia· Volume 185
Publisher page

Abstract

Abstract The top surface of a crystal–melt interface was observed directly during directional solidification of polycrystalline GaSb at a constant cooling rate, and the effect of {111}Σ3 twin boundary formation on the rate of grain growth parallel to the 〈111〉 direction was investigated. A {111}Σ3 twin boundary was generated by the decomposition of another {111}Σ3 twin boundary with formation of a Σ9 grain boundary. The growth of the crystal–melt interface in the direction parallel to the B direction was stalled during the nucleation and propagation of the new {111}Σ3 twin boundary. The growth rate of the crystal–melt interface after twin formation was approximately half of that before. This is considered to be due to {111} polarity reversal by twinning. The dangling bond density on the {111}A plane of GaSb is almost ten times of that on the {111}B plane, and the dangling bond density is related to the attachment energy of atoms of the plane; therefore, the growth rate in the A direction would be significantly lower than that in the B direction. These results indicate different growth rates in opposite 〈111〉 directions and a significant effect of the polarity on the competition of grain growth during the directional solidification of polycrystalline GaSb.
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Research context

OpenAlex topics: Advanced Semiconductor Detectors and Materials · Semiconductor Quantum Structures and Devices · Solidification and crystal growth phenomena

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References (38)

Show source-provided references
1. The physics and technology of gallium antimonide: an emerging optoelectronic material10.1063/1.365356 ↗
2. Lasers and photodetectors for mid-infrared 2–3 µm applications10.1063/1.3002408 ↗
3. GaSb photovoltaic cells for applications in TPV generators10.1088/0268-1242/18/5/307 ↗
4. Characteristics of the {111} surfaces of the III–V intermetallic compounds10.1149/1.2427712 ↗
5. Effect of the polarity of the III‐V intermetallic compounds on etching10.1063/1.1735567 ↗
6. Polarity effects in III–V semiconducting compounds10.1016/0022-3697(65)90090-9 ↗
7. (111) surface tensions of III–V compounds and their relationship to spontaneous bending of thin crystals10.1016/0039-6028(64)90006-8 ↗
8. Surface polarity and symmetry in semiconducting compounds10.1007/BF01154024 ↗
9. Guide to references on III–V semiconductor chemical etching10.1016/S0927-796X(00)00027-9 ↗
10. Investigation of directionally solidified InGaSb ternary alloys from Ga and Sb faces of GaSb(111) under prolonged microgravity at the international space station10.1038/npjmgrav.2016.26 ↗
11. Orientation-dependent dissolution and growth kinetics of InxGa1−xSb by vertical gradient freezing method under microgravity10.1016/j.jcrysgro.2018.04.033 ↗
12. In situ observation for semiconductor solution growth using a near-infrared microscope10.1016/j.jcrysgro.2004.10.082 ↗
13. Growth of InSb crystals in the <111>polar direction10.1063/1.1735403 ↗
14. Growth of GaAs crystals in the <111>polar direction10.1063/1.1735930 ↗
15. Indium antimonide—a review of its preparation, properties and device applications10.1016/0038-1101(62)90104-1 ↗
16. Growth peculiarities of gallium arsenide single crystals10.1016/0038-1101(63)90055-8 ↗
17. Growth of gallium arsenide by horizontal zone melting10.1063/1.1735635 ↗
18. In-situ observations of melt growth behavior of polycrystalline silicon10.1016/j.jcrysgro.2003.10.075 ↗
19. Morphological transformation of a crystal–melt interface during unidirectional growth of silicon10.1016/j.actamat.2011.04.016 ↗
20. Formation mechanism of a faceted interface: in situ observation of the si(100) crystal–melt interface during crystal growth10.1103/PhysRevB.80.174108 ↗
21. Crystal growth of ternary alloy semiconductor and preliminary study for microgravity experiment at the international space station
22. The effect of grain boundary characteristics on the morphology of the crystal–melt interface of multicrystalline silicon10.1016/j.scriptamat.2013.04.015 ↗
23. In situ observation of grain-boundary development from a facet-facet groove during solidification of silicon10.1016/j.actamat.2018.04.062 ↗
24. Evolution of grain structures during directional solidification of silicon wafers10.1016/j.jcrysgro.2015.12.050 ↗
25. A {112}Σ3 grain boundary generated from the decomposition of a Σ9 grain boundary in multicrystalline silicon during directional solidification10.1016/j.scriptamat.2019.03.037 ↗
26. Grain boundaries in the sphalerite structure10.1016/0022-3697(64)90053-8 ↗
27. Polarity reversal and symmetry in semiconducting compounds with the sphalerite and wurtzite structures10.1007/BF02403230 ↗
28. Formation of parallel (1 1 1) twin boundaries in silicon growth from the melt explained by molecular dynamics simulations10.1016/j.jcrysgro.2009.09.043 ↗
29. Twinning in multicrystalline silicon for solar cells10.1016/j.jcrysgro.2013.09.008 ↗
30. In situ investigation of the structural defect generation and evolution during the directional solidification of (110) seeded growth Si10.1016/j.actamat.2016.06.004 ↗
31. In situ observation of twin boundary formation at grain-boundary groove during directional solidification of Si10.1016/j.scriptamat.2017.02.028 ↗
32. Processes at the boundary of a crystallization front
33. A mechanism for twin formation during Czochralski and encapsulated vertical bridgman growth of III–V compound semiconductors10.1016/0022-0248(94)00666-0 ↗
34. On the twinning occurrence in bulk semiconductor crystal growth10.1016/j.scriptamat.2010.02.034 ↗
35. Revisiting the twinning mechanism in directional solidification of multi-crystalline silicon sheet10.1016/j.actamat.2017.03.077 ↗
36. The grain-grain-liquid triple phase line during solidification of multi-crystalline silicon10.1016/j.crhy.2012.12.003 ↗
37. Stacking fault energy and ionicity of cubic III–V compounds10.1002/pssa.2210450125 ↗
38. Characterization of the absolute crystal polarity across twin boundaries in gallium phosphide using convergent-beam electron diffraction10.1017/S1431927699000124 ↗