Electron inelastic mean free path in UO2 and (U, Pu)O2 fuels

Inelastic mean free path (IMFP) of UO ₂ and (U, Pu)O ₂ fuels at 0, 20, 50 and 95 at.% of Pu were determined for the first time using a combination of convergent beam electron diffraction (CBED) and electron energy loss spectroscopy (EELS) on TEM FIB lamellae. Non-linear least squares fit was performed on the CBED intensity profiles to only obtain the crystalline thickness of the sample with a precision of up to 0.2% [1] while EELS spectra were used to calculate the relative thickness of the sample: crystalline and amorphous contribution. The IMFP were determined to be 119 – 129 nm for UO ₂, 107 – 117 nm for (U, Pu)O ₂ at 20 at.% of Pu, 116 – 125 nm for (U, Pu)O ₂ at 50 at.% of Pu and 123 – 137 nm for (U, Pu)O ₂ at 95 at.% of Pu using collection semi-angles β = 23.4 – 11.6 mrad, convergence semi-angle α = 8 mrad and accelerated voltage of 200 keV on a Thermofischer TALOS F200X TEM in the LECA STAR hot laboratory (CEA Cadarache). A comparison with the most relevant models in the literature shows that for compounds with a comparable quantity of light and heavy elements it is better to use a mean atomic number instead of an effective one as proposed by different authors. The importance of accurate density determination is also emphasized if the IMFP values are to be predicted by the existed models. As a second part, a strategy is developed to calculate the effective refractive index at the nanometer scale for the fuels allowing to easily find the IMFP under different measurement parameters such as those in energy filtered transmission electron microscopy (EFTEM) maps.