journal article·1996-01

EPMA and XPS studies of TiAlSiC interfacial chemical compatibility

Jean-François Silvain, Jean-Claude Bihr, Yann Lepetitcorps

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Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

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Research context

OpenAlex topics: Intermetallics and Advanced Alloy Properties · MXene and MAX Phase Materials · Semiconductor materials and interfaces

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References (20)

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