Interface step-induced thin-film delamination and buckling

Abstract Atomistic simulations based on experimental observations provide the first evidence that the interface delamination of a thin film from its substrate may start from interface steps. Buckling of the film after interface gliding from both edges of its delaminated part is also observed. In the framework of the Foppl–von Karman theory of thin plates, the expression of the critical strain beyond which the film buckles has been then analytically determined as a function of the step height and gliding displacements. Both numerical and analytical results confirm that the formation of blisters is favoured in the neighbourhood of interfacial imperfections.