Solid state formation of Ti4AlN3 in cathodic arc deposited (Ti1−xAlx)Ny alloys
Source abstract
Abstract
Reactive cathodic arc deposition was used to grow substoichiometric solid solution cubic c-(Ti 1−xAl x)N y thin films. The films were removed from the substrate and then heated in an argon environment to 1400 °C. Via solid state reactions, formation of MAX phase Ti 4 AlN 3 was obtained. Additional phases such as Ti 2AlN, c-TiN, w-AlN, Al 5Ti 2 and Al 3Ti were also present during the solid state reaction. Ti 4AlN 3 formation was observed in samples with an Al metal fraction x < 0.63 and a nitrogen content 0.4 < y < 0.6. Regardless of the initial composition, formation of Ti 4AlN 3 started in Ti 2AlN crystal plates in the temperature range between 1200 and 1400 °C. Accompanying the onset of Ti 4AlN 3 was the presence of an intermediate structure identified as Ti 6Al 2N 4, consisting of alternating layers of intergrown Ti 2AlN and Ti 4AlN 3 phases with a half-unit-cell stacking. We suggest that the formation of Ti 4AlN 3 occurred via intercalation of aluminum and nitrogen along the basal plane accompanied by a simultaneous detwinning process. In addition we propose that this formation mechanism can be used to obtain MAX phases of high n order.
Source: expertdata · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Metal and Thin Film Mechanics · MXene and MAX Phase Materials · Semiconductor materials and devices
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (61)
Show source-provided references
1. The Mn-1AXn phases: a new class of solids10.1016/S0079-6786(00)00006-6 ↗
2. The MAX Phases: unique new carbide and nitride materials10.1511/2001.28.334 ↗
3. The Mn + 1AXn phases: materials science and thin-film processing10.1016/j.tsf.2009.07.184 ↗
4. Layered ternary Mn+1AXn phases and their 2D derivative MXene: an overview from a thin-film perspective10.1088/1361-6463/aa57bc ↗
5. Ti3SiC2 formed in annealed Al/Ti contacts to p-type SiC10.1016/S0169-4332(02)01195-9 ↗
6. Role of interface layers and localized states in TiAl-based Ohmic contacts to p-type 4H-SiC10.1007/s11664-006-0078-0 ↗
7. Single-step synthesis process of Ti3SiC2 ohmic contacts on 4H-SiC by sputter-deposition of Ti10.1016/j.scriptamat.2014.11.025 ↗
8. Crystallization kinetics of amorphous Cr2AlC thin films10.1016/j.surfcoat.2011.06.003 ↗
9. Crystallization kinetics of V2AlC10.1016/j.tsf.2011.09.037 ↗
10. Ion sputter-deposition and in-air crystallisation of Cr2AlC films10.1016/j.vacuum.2013.07.045 ↗
11. Topotaxial growth of Ti2AlN by solid state reaction in AlN∕Ti(0001) multilayer thin films10.1063/1.2731520 ↗
12. Formation of (Ti,Al)N∕Ti2AlN multilayers after annealing of TiN∕TiAl(N) multilayers deposited by ion beam sputtering10.1063/1.2894589 ↗
13. MAX phase formation by intercalation upon annealing of TiCx/Al (0.4 < x < 1) bilayer thin films10.1016/j.actamat.2011.06.029 ↗
14. Formation of Ti2AlN nanolaminate films by multilayer-deposition and subsequent rapid thermal annealing10.1016/j.matlet.2012.05.055 ↗
15. Thin film synthesis of Ti3SiC2 by rapid thermal processing of magnetron-sputtered Ti-C-Si multilayer systems10.1002/adem.201200180 ↗
16. Theory of the ternary layered system Ti-Al-N10.1063/1.1476076 ↗
17. Ti2AlN thin films synthesized by annealing of (Ti+Al)/AlN multilayers10.1016/j.materresbull.2016.03.031 ↗
18. Deposition of single-crystal Ti2AlN thin films by reactive magnetron sputtering from a 2Ti:Al compound target10.1063/1.2785958 ↗
19. Epitaxial Ti2AlN(0001) thin film deposition by dual-target reactive magnetron sputtering10.1016/j.actamat.2007.04.006 ↗
20. The influence of substrate temperature and Al mobility on the microstructural evolution of magnetron sputtered ternary Ti-Al-N thin films10.1063/1.3208065 ↗
21. Temperature-dependent microstructural evolution of Ti2AlN thin films deposited by reactive magnetron sputtering10.1016/j.apsusc.2016.01.229 ↗
22. High-resolution transmission electron microscopy of Ti4AlN3, or Ti3Al2N2 revisited10.1111/j.1151-2916.1999.tb02117.x ↗
23. Synthesis of Ti4AlN3 and phase equilibria in the Ti-Al-N system
24. Decomposition and phase transformation in TiCrAlN thin coatings10.1116/1.4757953 ↗
25. In situ site-specific specimen preparation for atom probe tomography10.1016/j.ultramic.2006.06.008 ↗
26. The post-ionization of field evaporated ions: a theoretical explanation of multiple charge states10.1016/0039-6028(82)90434-4 ↗
27. Gault · 2012
28. Impact of nitrogen vacancies on the high temperature behavior of (Ti1−xAlx)Ny alloys10.1016/j.actamat.2016.08.024 ↗
29. Origin of the nitrogen over- and understoichiometry in Ti0.5Al0.5N thin films10.1088/0953-8984/24/15/155401 ↗
30. Significant elastic anisotropy in Ti1−xAlxN alloys10.1063/1.3524502 ↗
31. First-principles study of the effect of nitrogen vacancies on the decomposition pattern in cubic Ti1−xAlxN1−y10.1063/1.2838747 ↗
32. Structure of Ti4AlN3-a layered Mn+1AXn nitride10.1016/S0025-5408(00)00383-4 ↗
33. Theoretical study of nitrogen vacancies in Ti4AlN310.1063/1.1854744 ↗
34. Mn+1AXn phases in the Ti-Si-C system studied by thin-film synthesis and ab initio calculations10.1103/PhysRevB.70.165401 ↗
35. The effects of nitrogen flow on reactively sputtered Ti-Al-N films10.1016/0257-8972(94)02300-F ↗
36. Mixing and decomposition thermodynamics of c-Ti1−xAlxN from first-principles calculations10.1103/PhysRevB.75.045123 ↗
37. Lattice vibrations change the solid solubility of an alloy at high temperatures10.1103/PhysRevLett.117.205502 ↗
38. Reaction between AlN and metal thin films during high temperature annealing10.2109/jcersj.101.969 ↗
39. Investigation of the interface reactions of Ti thin films with AlN substrate10.1557/JMR.1997.0123 ↗
40. Interfacial reactions in single-crystal-TiN (100)/Al/polycrystalline-TiN multilayer thin films10.1016/0040-6090(92)90430-J ↗
41. Deposition and characterization of ternary thin films within the Ti-Al-C system by DC magnetron sputtering10.1016/j.jcrysgro.2006.03.008 ↗
42. Interface reactions between titanium thin films aluminium nitride substrates10.1111/j.1151-2916.1999.tb01953.x ↗
43. Thermal stability of nitride thin films10.1016/S0042-207X(00)00143-3 ↗
44. Stability trends of MAX phases from first principles10.1103/PhysRevB.81.220102 ↗
45. A thermodynamic description of the Ti-Al system10.1016/S0966-9795(97)00030-7 ↗
46. New ternary nitride in the Ti-Al-N system10.1111/j.1151-2916.1997.tb02874.x ↗
47. Inter-conversion of Mn+1AXn phases in the Ti-Al-C system10.1111/j.1551-2916.2007.01710.x ↗
48. Phase stability of epitaxially grown Ti2AlN thin films10.1063/1.2335681 ↗
49. Crystallographic relations between Ti3SiC2 and TiC10.1007/PL00010876 ↗
50. The design of crystalline precursors for the synthesis of M n-1AXn phases and their application to Ti3AlC210.1111/j.1551-2916.2007.01728.x ↗
51. A new solid state synthesis methodology for ternary and higher order compounds
52. Thermal stability of Ti3SiC2 thin films10.1016/j.actamat.2006.10.010 ↗
53. Si-induced twinning of TiC and formation of Ti3SiC2 platelets10.1016/S1359-6454(02)00248-3 ↗
54. Synthesis of the Ti3SiC2 by solid state reaction below melting temperature of Si10.1016/j.jallcom.2004.08.089 ↗
55. Synthesis of Ti3AlC2 from Ti/Al4C3/C studied by in situ neutron diffraction10.1111/j.1551-2916.2005.00745.x ↗
56. Structure of a new bulk Ti5Al2C3 MAX phase produced by the topotactic transformation of Ti2AlC10.1016/j.jeurceramsoc.2012.03.035 ↗
57. Comment on “Ti5Al2C3: a New ternary carbide belonging to MAX phases in the Ti-Al-C system”10.1111/j.1551-2916.2012.05299.x ↗
58. High-temperature neutron diffraction and first-principles study of temperature-dependent crystal structures and atomic vibrations in Ti3AlC2, Ti2AlC, and Ti5Al2C310.1063/1.4803700 ↗
59. Crystal structure determination of nanolaminated Ti5Al2C3 by combined techniques of XRPD, TEM and ab initio calculations10.1007/s40145-012-0034-9 ↗
60. Epitaxial Ti2GeC, Ti3GeC2, and Ti4GeC3 MAX-phase thin films grown by magnetron sputtering10.1557/JMR.2005.0105 ↗
61. Epitaxial growth and electrical-transport properties of Ti 7Si2C5 thin films synthesized by reactive sputter-deposition10.1016/j.scriptamat.2011.07.038 ↗