journal article·1998-07

Diffusional back flows during electromigration

I.A. Blech

Acta Materialia· Volume 46· Issue 11
Publisher page

Abstract

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Research context

OpenAlex topics: Copper Interconnects and Reliability · Metal and Thin Film Mechanics · Electronic Packaging and Soldering Technologies

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References (10)

Show source-provided references
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2. Blech · Appl. Phys. Lett. · 1976 · 29 · 13110.1063/1.89024 ↗
3. Blech · Appl. Phys. Lett. · 1977 · 30 · 38710.1063/1.89414 ↗
4. Nikawa, K., IEEE Proceedings of the 19th International Reliability Physics Symposium, Vol. 19, 1981, p. 17510.1109/IRPS.1981.362992 ↗
5. Kinsbron · Appl. Phys. Lett. · 1980 · 36 · 96810.1063/1.91385 ↗
6. Blech · Thin Solid Films · 1975 · 25 · 32710.1016/0040-6090(75)90052-8 ↗
7. Herring, C., in Structure and Properties of Solid Surfaces, ed. R. Gomer and C. S. Smith. University of Chicago Press, 1953, p. 5
8. Herring · Scripta metall. · 1971 · 5 · 27310.1016/0036-9748(71)90193-1 ↗
9. Ross · J. Appl. Phys. · 1989 · 66 · 234910.1063/1.344266 ↗
10. Hu · Appl. Phys. Lett. · 1993 · 62 · 102310.1063/1.108513 ↗