Enabling quantitative analysis of in situ TEM experiments: A high-throughput, deep learning-based approach tailored to the dynamics of dislocations

In situ TEM is by far the most commonly used microscopy method for imaging dislocations, i.e., line-like defects in crystalline materials. However, quantitative image analysis so far was not possible, implying that also statistical analyses were strongly limited. In this work, we created a deep learning-based digital twin of an in situ TEM straining experiment, additionally allowing to perform matching simulations. As application we extract spatio-temporal information of moving dislocations from experiments carried out on a Cantor high entropy alloy and investigate the universality class of plastic strain avalanches. We can directly observe "stick- slip motion"of single dislocations and compute the corresponding avalanche statistics. The distributions turn out to be scale-free, and the exponent of the power law distribution exhibits independence on the driving stress. The introduced methodology is entirely generic and has the potential to turn meso-scale TEM microscopy into a truly quantitative and reproducible approach.