Quantitative measurements of grain boundary excess volume from HAADF-STEM micrographs
Source abstract
Abstract
Abstract A novel approach for quantitative measurements of grain boundary (GB) excess volume has been developed using correlative analytical transmission electron microscopy (TEM) and successfully demonstrated for several simulated symmetrical [100] tilt GB configurations as well as for the experimental case of an Al bicrystal containing a near Σ13 GB with an additional twist component. The reliability and precision of this new approach is analyzed and the limitations are discussed.
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Microstructure and mechanical properties · Surface and Thin Film Phenomena · Advanced Materials Characterization Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
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