Experimental quantification of mechanically induced boundary migration in nanocrystalline copper films
Source abstract
Abstract
Abstract A new experimental technique is presented that combines in situ straining with transmission electron microscope-based automated crystal orientation mapping to document microstructural evolution with nanoscale resolution at sequential stages of deformation. Orientation maps of freestanding annealed nanocrystalline Cu films have been collected, and the resultant datasets provide direct measures of grain size, shape and orientation as well as local grain boundary character and position at various stages of applied strain. Numerous examples of stress-driven grain boundary and twin boundary migration were recorded and studied. Detailed analysis of the misorientation of mobile and immobile grain boundaries provided clear experimental evidence that a broad range of grain boundaries are susceptible to stress-assisted migration; no general correlation between grain boundary misorientation and mobility was detected. Incoherent Σ3 boundaries were observed to be significantly more mobile than coherent Σ3 twin boundaries. Nevertheless, deformation twins were observed to nucleate and grow from grain boundaries and triple points.
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Microstructure and mechanical properties · Aluminum Alloys Composites Properties
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
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