Processing of Infrared Spectroscopy Data on Thin Porous Films Using Software “Prospect”
Source abstract
Abstract
Here we present the software utility “ProSpect” which allows to process and interpret the data of infrared spectrophotometry studies of thin porous films. These spectra are often complicated by the presence of interference fringes. The program allows to remove fringes and thus enhance the intensity of useful IR bands as well as calculate optical parameters of the films (medium thickness value, refractive index, deviation of the thickness from medium value). Application of ProSpect in analysis of the FT-IR spectra of non-uniform porous silicon films is illustrated.
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Silicon Nanostructures and Photoluminescence · Semiconductor materials and devices · Aerogels and thermal insulation
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References (3)
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1. V.P. Parkhutik, Programade Tratamiento de Espectros Infrarrojos “ProSpect”, Los Practicas del Laboratorio en Física de Estado Sólido, UPV, Valencia, 1997, p. 123.
2. M. Krüger, R. Arens-Fisher, M. Thönissen, H. Münder, M.G. Berger, H. Lüth, S. Hilbrich, and W. Theiss, Thin Solid Films 276, 257 (1996).10.1016/0040-6090(95)08066-X ↗
3. M. Born and E. Wolf, Principles of Optics (Oxford Press, 1975).