TEM investigation of the microstructure and defects of CuZr martensite. Part II: Planar defects
Bibliographic record
Abstract
No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.
Source: Not provided · Quality: missing
Research context
OpenAlex topics: X-ray Diffraction in Crystallography · Microstructure and mechanical properties · Semiconductor materials and interfaces
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (7)
Show source-provided references
1. Seo · Acta mater. · 1998 · 46 · 116510.1016/S1359-6454(97)00333-9 ↗
2. Schryvers · Scripta metall. mater · 1977 · 36 · 111910.1016/S1359-6462(97)00003-1 ↗
3. Kudoh · Acta metall. · 1985 · 33 · 204910.1016/0001-6160(85)90128-2 ↗
4. Moberly · 1992 · 55
5. Nishida · 1992 · 975
6. Koval · Scripta metall. mater. · 1994 · 31 · 79910.1016/0956-716X(94)90481-2 ↗
7. Van Humbeeck, J. and Firstov, G., Private communications.