journal article·2014-03

Mechanical assessment of suspended ALD thin films by bulge and shaft-loading techniques

Maria Berdova, Tuomo Ylitalo, Ivan Kassamakov, Jouni Heino, Pekka T. Törmä, Lauri Kilpi, Helena Ronkainen, Jari Koskinen, Edward Hæggström, Sami Franssila

Acta Materialia· Volume 66
Publisher page

Abstract

We assessed mechanical properties of free-standing atomic-layer-deposited (ALD) Al2O3 thin films, mixed oxide (AlxTiyOz) films and Al2O3/TiO2 nanolaminates (75 and 200 nm). Using bulge and microelectromechanical system shaft-loading techniques, we evaluated the Young’s modulus, residual stress and ultimate tensile stress of these films and laminates. Fits to the load–displacement curves provided estimates for the residual stress and Young’s modulus. We extracted a residual stress of 347–403 MPa for Al2O3, 365–389 MPa for AlxTiyOz and 450–455 MPa for the nanolaminate. The Young’s modulus was 164–165 GPa for Al2O3, 151–154 GPa for mixed oxide and 148–169 GPa for the nanolaminate. Thin membranes exhibited an ultimate tensile strength of 1.57–2.56 GPa for Al2O3, 1.17–2.09 GPa for AlxTiyOz and 1.23–2.26 GPa for the nanolaminate. The ability to make thin, yet mechanically strong, suspended membranes is useful in micro- and nanosystem applications ranging from thermally insulated devices to large stroke mechanical actuators.
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Research context

OpenAlex topics: Semiconductor materials and devices · Metal and Thin Film Mechanics · Diamond and Carbon-based Materials Research

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References (52)

Show source-provided references
1. Huang · IEEE Trans Dev Mater Res · 2012 · 12 · 48210.1109/TDMR.2012.2191291 ↗
2. van Spengen · Microelectron Reliab · 2003 · 43 · 104910.1016/S0026-2714(03)00119-7 ↗
3. Mayer · Appl Phys Lett · 2003 · 82 · 288310.1063/1.1570926 ↗
4. He · Sens Actuat A Phys · 2012 · 188 · 34210.1016/j.sna.2012.03.013 ↗
5. Budnitzki · Appl Phys Lett · 2009 · 94 · 14190610.1063/1.3112565 ↗
6. Hoivik · Sensor Actuat A Phys · 2003 · 103 · 10010.1016/S0924-4247(02)00319-9 ↗
7. Read · 2007
8. Ranjana · Acta Mater · 2002 · 50 · 2310.1016/S1359-6454(01)00328-7 ↗
9. Yi · Meas Sci Technol · 1999 · 10 · 70610.1088/0957-0233/10/8/305 ↗
10. Allen · Appl Phys Lett · 1987 · 51 · 24110.1063/1.98460 ↗
11. Jiang · Nat Mater · 2004 · 3 · 72110.1038/nmat1212 ↗
12. Poilane · Thin Solid Films · 2000 · 379 · 15610.1016/S0040-6090(00)01401-2 ↗
13. Small · J Mater Res · 1992 · 7 · 155310.1557/JMR.1992.1553 ↗
14. Bromley · J Vac Sci Technol B · 1983 · 1 · 136410.1116/1.582744 ↗
15. Lin P. Doctoral thesis. Massachusetts Institute of Technology, Cambridge, MA, USA; 1990.
16. Berdova · J Vac Sci Technol A · 2013 · 31 · 03110210.1116/1.4801921 ↗
17. Wan · J Mater Sci · 1996 · 31 · 210910.1007/BF00356633 ↗
18. Na · Langmuir · 2011 · 28 · 667710.1021/la300877r ↗
19. Xu · Appl Phys Lett · 2002 · 81 · 283310.1063/1.1511532 ↗
20. Liu · J Phys D Appl Phys · 2001 · 34 · L9110.1088/0022-3727/34/15/102 ↗
21. Mitchell · J Aerosp Eng · 2003 · 16 · 4610.1061/(ASCE)0893-1321(2003)16:2(46) ↗
22. Leskelä · Angew Chem Int Ed Engl · 2003 · 42 · 554810.1002/anie.200301652 ↗
23. Miikkulainen · J Appl Phys · 2013 · 113 · 02130110.1063/1.4757907 ↗
24. Sainiemi · J Vac Sci Technol B · 2007 · 25 · 80110.1116/1.2734157 ↗
25. Dekker · J Vac Sci Technol B · 2006 · 24 · 235010.1116/1.2353844 ↗
26. Jokinen · Biomicrofluidics · 2012 · 6 · 01650110.1063/1.3673251 ↗
27. Kassamakov · Microelectron Eng · 2007 · 84 · 11410.1016/j.mee.2006.08.013 ↗
28. Simmons G, Wang H. Single crystal elastic constants and calculated aggregate properties. In: A handbook, 2nd ed. Cambridge, MA: MIT Press; 1971.
29. Borgese · Surf Coat Technol · 2012 · 206 · 245910.1016/j.surfcoat.2011.10.050 ↗
30. Pickhardt · J Vac Sci Technol · 1977 · 14 · 82310.1116/1.569276 ↗
31. Xianghui · Beilstein J Nanotechnol · 2011 · 2 · 82610.3762/bjnano.2.92 ↗
32. Wan · J Adhes · 2001 · 75 · 36910.1080/00218460108029611 ↗
33. Wan · J Adhes · 2003 · 79 · 12310.1080/00218460309573 ↗
34. Greek · Thin Solid Films · 1997 · 292 · 24710.1016/S0040-6090(96)09076-1 ↗
35. Borrero-López · Scripta Mater · 2009 · 60 · 93710.1016/j.scriptamat.2009.01.042 ↗
36. Wang · Nano Lett · 2012 · 12 · 370610.1021/nl3014956 ↗
37. Tripp · Sens Actuat A Phys · 2006 · 130 · 41910.1016/j.sna.2006.01.029 ↗
38. Puurunen · Electrochem Soc S Trans · 2007 · 11 · 3
39. Van Rijn · J Microelectromech Syst · 1997 · 6 · 4810.1109/84.557530 ↗
40. Hoffman · MRS Proc · 1988 · 13010.1557/PROC-130-295 ↗
41. Buchheit · MRS Proc · 1998 · 54610.1557/PROC-546-121 ↗
42. Neugebauer · J App Phys · 1960 · 31 · 109610.1063/1.1735751 ↗
43. Reinhard · J Vac Sci Technol B · 2004 · 22 · 281110.1116/1.1819928 ↗
44. Jackson · MRS Proc · 2001 · 68710.1557/PROC-687-B6.3 ↗
45. Sharpe · Exp Mech · 1999 · 39 · 16210.1007/BF02323548 ↗
46. Tsuchiya · Sakata J Sens Actuat A Phys · 2000 · 82 · 28610.1016/S0924-4247(99)00363-5 ↗
47. Cardinale · Thin Solid Films · 1992 · 207 · 12610.1016/0040-6090(92)90112-O ↗
48. Edwards · Exp Mech · 2004 · 44 · 4910.1007/BF02427976 ↗
49. Koskinen · MRS Proc · 1988 · 13010.1557/PROC-130-63 ↗
50. Krautheim · Appl Surf Sci · 2005 · 252 · 20010.1016/j.apsusc.2005.01.118 ↗
51. Ylivaara OME, Liu XW, Kilpi L, Lyytinen J, Schneider D, Laitinen M, et al. (accepted for publication).
52. Zhang · Nanoscale · 2012 · 4 · 654310.1039/c2nr32016a ↗