Microband evolution during large plastic strains of stable {110}〈112〉 Al and Al–Mn crystals

Abstract The deformation microstructures of Al and Al–Mn {1 1 0}〈1 1 2〉 single crystals have been characterized after room temperature channel-die compression up to true strains of 2.1. The evolution of local misorientations and microband structures were quantified by high-resolution electron backscatter diffraction in a field emission gun scanning electron microscope and their alignments compared with the traces of active slip planes and macroscopic shear stress planes. During plane-strain compression these “Brass” oriented crystals remain stable in terms of the final, average, orientation, with a small orientation spread. However, the microband alignment varies with strain and also with solute content. There is a general tendency for the microbands to be both crystallographic and non-crystallographic at low strains, then crystallographic, and finally mixed again at high strains (with some lamellar banding).