journal article·2014-11Open access

Solid solution effects in the Ti2Al(C N ) MAX phases: Synthesis, microstructure, electronic structure and transport properties

W. Yu, V. Mauchamp, T. Cabioc’h, D. Magne, L. Gence, L. Piraux, V. Gauthier-Brunet, S. Dubois

Acta Materialia· Volume 80

Abstract

Ti2AlCxNy solid solutions are synthesized using hot isostatic pressing. The X site solid solution effects are investigated, focusing on the microstructure, electronic structure and transport properties of the Ti2AlCxNy MAX phases. Combining X-ray diffraction with scanning electron microscopy and wavelength dispersive X-ray spectroscopy measurements, it is shown that solid solutions can be synthesized with well-controlled chemical compositions in the entire composition range (x = 0–1). The measured a and c lattice-parameter values are shown to be in good agreement with those calculated using the cluster-expansion formalism. Combining electron energy-loss spectroscopy (EELS) and band structure calculations, it is demonstrated by Arroyave et al. that solid solution effects induce weak perturbations on the electronic structure. The solid solution effect thus results mainly in a rigid shift of the Fermi energy in a flat part of the electron density of states of Ti2AlC (or Ti2AlN). From these observations, the variations in two key parameters of the conductivity are rationalized. The relative variations in the residual resistivity in the whole composition range are shown to be small, which agrees well with the weak disorder evidenced by EELS. However, the values of the slope of the variation in resistivity vs. temperature are shown to vary quite significantly, evidencing a deviation from Matthiessen’s rule in these systems. By comparing the experimental data with calculations based on the semi-classical Boltzmann equation, it is demonstrated that the observed variations are due to a combination of band structure effects and changes in the scattering mechanisms. Finally, vacancies are also shown to have a prominent effect on the transport properties of Ti2AlCxNy solid solutions. In particular, both residual resistivity and dq(T)/dT values are shown to be significantly higher than those of the corresponding stoichiometric compounds.
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Research context

OpenAlex topics: MXene and MAX Phase Materials · 2D Materials and Applications · Advanced Photocatalysis Techniques

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (76)

Show source-provided references
1. Jeitschko · Monatsh Chem · 1967 · 98 · 32910.1007/BF00899949 ↗
2. Jeitschko · Monatsh Chem · 1963 · 94 · 67210.1007/BF00913068 ↗
3. Jeitschko · Monatsh Chem · 1964 · 95 · 43110.1007/BF00901306 ↗
4. Wolfsgruber · Monatsh Chem · 1967 · 98 · 240310.1007/BF00902438 ↗
5. Nowotny · Prog Solid State Chem · 1971 · 5 · 2710.1016/0079-6786(71)90016-1 ↗
6. Barsoum · J Am Ceram Soc · 1996 · 79 · 195310.1111/j.1151-2916.1996.tb08018.x ↗
7. Barsoum · J Am Ceram Soc · 1999 · 82 · 254510.1111/j.1151-2916.1999.tb02117.x ↗
8. Rawn · Mater Res Bull · 2000 · 35 · 178510.1016/S0025-5408(00)00383-4 ↗
9. Barsoum · Prog Solid State Chem · 2000 · 28 · 20110.1016/S0079-6786(00)00006-6 ↗
10. Schuster · J Solid State Chem · 1980 · 32 · 21310.1016/0022-4596(80)90569-1 ↗
11. Gupta · J Electrochem Soc · 2004 · 151 · D2410.1149/1.1639160 ↗
12. Ganguly · J Alloys Compd · 2004 · 376 · 28710.1016/j.jallcom.2004.01.011 ↗
13. Zhou · Acta mater · 2006 · 54 · 131710.1016/j.actamat.2005.10.057 ↗
14. Finkel · Phys Rev B · 2004 · 70 · 08510410.1103/PhysRevB.70.085104 ↗
15. Dubois · Int J Appl Ceram Technol · 2010 · 7 · 71910.1111/j.1744-7402.2010.02554.x ↗
16. Rosén · Appl Phys Lett · 2010 · 97 · 07310310.1063/1.3472280 ↗
17. Cabioc’h · J Eur Ceram Soc · 2013 · 33 · 89710.1016/j.jeurceramsoc.2012.10.008 ↗
18. Buchholt · Appl Phys Lett · 2011 · 98 · 04210810.1063/1.3549198 ↗
19. Wang · Phys Rev B · 2009 · 80 · 24530310.1103/PhysRevB.80.245303 ↗
20. Borysiewicz · Acta Phys Pol A · 2008 · 114 · 106110.12693/APhysPolA.114.1061 ↗
21. Drevin-Bazin · Trans Tech Publ · 2012 · 711 · 184
22. Hoffman · Nucl Eng Des · 2012 · 244 · 1710.1016/j.nucengdes.2011.12.009 ↗
23. Ingason · Phys Rev Lett · 2013 · 110 · 19550210.1103/PhysRevLett.110.195502 ↗
24. Naguib · ACS Nano · 2012 · 6 · 132210.1021/nn204153h ↗
25. Naguib · Adv Mater · 2014 · 26 · 99210.1002/adma.201304138 ↗
26. Mauchamp · Phys Rev B · 2014 · 89 · 23542810.1103/PhysRevB.89.235428 ↗
27. Halim · Chem Mater · 2014 · 26 · 237410.1021/cm500641a ↗
28. Zhou · J Am Ceram Soc · 2008 · 91 · 135710.1111/j.1551-2916.2008.02279.x ↗
29. Barsoum · Metall Mater Trans A · 2000 · 31 · 185710.1007/s11661-006-0243-3 ↗
30. Cabioc’h · J Eur Ceram Soc · 2012 · 32 · 180310.1016/j.jeurceramsoc.2011.12.011 ↗
31. Radovic · J Mater Res · 2008 · 23 · 151710.1557/JMR.2008.0200 ↗
32. Du · Phys Lett A · 2009 · 374 · 7810.1016/j.physleta.2009.10.023 ↗
33. Scabarozi · J Appl Phys · 2008 · 104 · 07371310.1063/1.2979326 ↗
34. Wang · Z Metallkd · 2002 · 93 · 6610.3139/146.020066 ↗
35. Wang · Trans Nonferrous Met Soc China · 2007 · 17 · 100110.1016/S1003-6326(07)60215-5 ↗
36. Williams · Phys Rev · 1964 · 135 · A50510.1103/PhysRev.135.A505 ↗
37. Shacklette · J Appl Phys · 1971 · 42 · 469810.1063/1.1659841 ↗
38. Eklund · Thin Solid Films · 2010 · 518 · 185110.1016/j.tsf.2009.07.184 ↗
39. Egerton · 1996
40. Pennycook · Eur Phys J Appl Phys · 2011 · 54 · 3350710.1051/epjap/2011100413 ↗
41. Krayzman · Phys Rev B · 2006 · 74 · 22410410.1103/PhysRevB.74.224104 ↗
42. Bugnet · Acta Mater · 2013 · 61 · 734810.1016/j.actamat.2013.08.041 ↗
43. Calmels · Phys Rev B · 2006 · 73 · 02420710.1103/PhysRevB.73.024207 ↗
44. Yu · J Am Ceram Soc · 2014 · 97 · 230810.1111/jace.12930 ↗
45. Lutterotti L, Matthies S, Wenk H. ICOTOM-12, vol. 1. Ottawa; 1999. p. 1599.
46. Rehr · Phys Chem Chem Phys · 2010 · 12 · 550310.1039/b926434e ↗
47. Rehr · C R Phys · 2009 · 10 · 54810.1016/j.crhy.2008.08.004 ↗
48. Jorissen · Phys Rev B · 2010 · 81 · 15510810.1103/PhysRevB.81.155108 ↗
49. Blaha P, Schwarz K, Madsen GKH, Kvaniscka D, Luitz J, WIEN2k, an augmented plane wave+local orbitals program for calculating crystal properties. Technische Universität Wien, 2001.
50. Perdew · Phys Rev Lett · 1996 · 77 · 386510.1103/PhysRevLett.77.3865 ↗
51. Arróyave · Phys Rev B · 2011 · 84 · 13411210.1103/PhysRevB.84.134112 ↗
52. Madsen · Comput Phys Commun · 2006 · 175 · 6710.1016/j.cpc.2006.03.007 ↗
53. Cordero · Dalton Trans · 2008 · 283210.1039/b801115j ↗
54. Zhou · Phys Rev B · 2000 · 61 · 1257010.1103/PhysRevB.61.12570 ↗
55. Wokulska · J Alloys Compd · 1998 · 264 · 22310.1016/S0925-8388(97)00260-0 ↗
56. Manoun · J Phys Chem Solids · 2006 · 67 · 209110.1016/j.jpcs.2006.05.051 ↗
57. Yan · Ceram Int · 2008 · 34 · 143910.1016/j.ceramint.2007.04.009 ↗
58. Gamarnik · Powder Diffr · 2000 · 15 · 24110.1017/S0885715600011167 ↗
59. Lin · Acta Mater · 2006 · 54 · 100910.1016/j.actamat.2005.10.028 ↗
60. Mauchamp · Phys Rev B · 2010 · 81 · 03510910.1103/PhysRevB.81.035109 ↗
61. Mauchamp · Phys Rev B · 2012 · 86 · 12510910.1103/PhysRevB.86.125109 ↗
62. Hug · Ultramicroscopy · 2010 · 110 · 105410.1016/j.ultramic.2010.05.007 ↗
63. Haddad · J Appl Phys · 2008 · 104 · 02353110.1063/1.2960340 ↗
64. Bugnet M, Jaouen M, Mauchamp V, Cabioc’h T, Hug G, Phys. Rev. B. (submitted for publication).
65. Hug · Phys Rev B · 2005 · 71 · 02410510.1103/PhysRevB.71.024105 ↗
66. Hettinger · Phys Rev B · 2005 · 72 · 11512010.1103/PhysRevB.72.115120 ↗
67. Finkel · Phys Rev B · 2001 · 65 · 03511310.1103/PhysRevB.65.035113 ↗
68. Sun · Phys Rev B · 1999 · 60 · 144110.1103/PhysRevB.60.1441 ↗
69. Lofland · Appl Phys Lett · 2004 · 84 · 50810.1063/1.1641177 ↗
70. Hug · Phys Rev B · 2006 · 74 · 18411310.1103/PhysRevB.74.184113 ↗
71. Mooij · Phys Status solidi A · 1973 · 17 · 52110.1002/pssa.2210170217 ↗
72. Seth · Phys Rev B · 1970 · 2 · 296110.1103/PhysRevB.2.2961 ↗
73. Mauchamp · Phys Rev B · 2013 · 87 · 23510510.1103/PhysRevB.87.235105 ↗
74. Otani · J Mater Sci · 1986 · 21 · 101110.1007/BF01117387 ↗
75. Barsoum · Metall Mater Trans A · 2002 · 33 · 277510.1007/s11661-002-0262-7 ↗
76. Barsoum · J Alloys Compd · 2002 · 340 · 17310.1016/S0925-8388(02)00107-X ↗