Atom probe study of sodium distribution in polycrystalline Cu(In,Ga)Se2 thin film
Source abstract
Abstract
Abstract This article reports the first investigations of CuIn1−xGaxSe2 (CIGSe) polycrystalline thin films by means of atom probe tomography. Attention is focused on the distribution of Na atoms within the films. Both Na-containing and Na-free CIGSe thin films have been investigated. When Na is available during the CIGSe coevaporation, it is observed to be mainly segregated at the grain boundaries of the films; however, it is also detected within the grains of CIGSe at very low concentration.
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Research context
OpenAlex topics: Advanced Materials Characterization Techniques · Chalcogenide Semiconductor Thin Films · nanoparticles nucleation surface interactions
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