Measurements of plastic displacement gradient components in three dimensions using marker particles and synchrotron X-ray absorption microtomography
Source abstract
Abstract
Abstract A universal method is presented for characterising the three-dimensional (3D) plastic displacement gradient field in bulk materials that contain particles or voids observable by X-ray tomography. Millimetre sized samples are investigated by absorption contrast microtomography using high intensity X-rays from a synchrotron source. The positions of dispersed marker particles are determined as a function of imposed strain. The particle diameter can be in the micrometre range, and the volume fraction can be less than 1%. The method is demonstrated by evaluation of compression deformation of a cylindrical Al specimen containing W marker particles. By interpolating the displacement gradient components determined at each particle on a 30×30×30 μm 3 grid, 3D maps of the displacement gradient components are obtained with a resolution of 10 −2 in each component. Limitations of the method are discussed, and the potential for application in materials science is outlined.
Source: openaire · Quality: candidate unverified · Source record ↗
Research context
OpenAlex topics: Advanced Surface Polishing Techniques · Force Microscopy Techniques and Applications · Microstructure and mechanical properties
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (25)
Show source-provided references
1. Bartholomeusz · Mater Charact · 1994 · 33 · 37710.1016/1044-5803(94)90142-2 ↗
2. Deposition of material at grain boundaries in tension interpreted in terms of diffusional creep10.1016/S0921-5093(98)01139-3 ↗
3. Liu · Scr Mater · 1997 · 36 · 118710.1016/S1359-6462(97)00013-4 ↗
4. Berka · Exp Tech · 1998 · 22 · 2210.1111/j.1747-1567.1998.tb01280.x ↗
5. Soppa · Comput Mater Sci · 1999 · 16 · 32310.1016/S0927-0256(99)00075-0 ↗
6. Crostack · J Microsc Oxford · 2001 · 201 · 17110.1046/j.1365-2818.2001.00772.x ↗
7. Tatschl · Mater Sci. Eng. A · 2003 · 339 · 26510.1016/S0921-5093(02)00111-9 ↗
8. Wert · Metallography · 1982 · 15 · 36710.1016/0026-0800(82)90028-3 ↗
9. Marschall · J Am Ceram Soc · 2000 · 83 · 22310.1111/j.1151-2916.2000.tb01176.x ↗
10. Yamaguchi · J Phys E Sci Instrum · 1981 · 14 · 127010.1088/0022-3735/14/11/012 ↗
11. Electronic speckle photography: increased accuracy by nonintegral pixel shifting10.1364/AO.33.006667 ↗
12. Tarnovskii · 1965
13. Wert · Acta Mater · 2002 · 50 · 312510.1016/S1359-6454(02)00116-7 ↗
14. Margulies · Science · 2001 · 291 · 239210.1126/science.1057956 ↗
15. Poulsen · J Synchrotron Rad · 1997 · 4 · 14710.1107/S0909049597002021 ↗
16. Juul Jensen · Mater Res Soc Symp Proc · 2000 · 590 · 22710.1557/PROC-590-227 ↗
17. Lauridsen · J Appl Crystallogr · 2001 · 34 · 74410.1107/S0021889801014170 ↗
18. Poulsen · J Appl Crystallogr · 2001 · 34 · 75110.1107/S0021889801014273 ↗
19. Kak · 1988
20. Computed medical imaging. Nobel lecture, Dec. 8, 197910.1097/00004728-198010000-00017 ↗
21. Beckmann F, Bonse U, Biermann T. In: Developments in X-ray Tomography II, Denver, CO, 1999 July. Proceedings of the SPIE Conference, vol. 3772. p. 179–87.10.1117/12.363719 ↗
22. Baruchel · Synchrotron Rad · 2000 · 7 · 19610.1107/S0909049500002995 ↗
23. Quan G, Beckmann F, Lippmann T, Heerens J, Brocks W. In: HASYLAB Annual Report; 2001.
24. Crostack H-A, Nellesen J, Beckmann F, Fischer G, Czayka W. In: HASYLAB Annual Report; 2001.
25. Humphreys · 1985 · 175