Time-Resolved Simultaneous Detection of Structural and Chemical Changes during Self-Assembly of Mesostructured Films
Source abstract
Abstract
In situ and time-resolved simultaneous analysis by two different and complementary techniques, Fourier transform infrared spectroscopy (FTIR) and small-angle X-ray scattering (SAXS), has been developed. A conventional source for the infrared light and synchrotron radiation for the X-ray beam have been used. The new technique has been applied to the study of self-assembling mesostructured films during dip-coating. The combined FTIR and SAXS analytical approach has given the possibility of getting a direct correlation between the chemical processes and the structural changes occurring in the film during the deposition.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Mesoporous Materials and Catalysis · Aerogels and thermal insulation · Catalytic Processes in Materials Science
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Laboratorio di Scienza dei Materiali e Nanotecnologie, Dipartimento di Architettura e Pianificazione, Università di Sassari, Nanoworld Institute and INSTM, Palazzo Pou Salid, Piazza Duomo 6, 07041 Alghero (Sassari), Italy, Dipartimento di Ingegneria Meccanica, Settore Materiali, Via Marzolo 9, 35131 Padova, Italy, Associazione CIVEN − Nano Fabrication Facility, Via delle Industrie 9, 30175 Marghera, Venezia, Italy, Laboratori Nazionali di Frascati − INFN, Via E. Fermi 40, 00044 Frascati (Roma), Italy,...
References (19)
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