Single Nanotube Voltammetry: Current Fluctuations Are Due to Physical Motion of the Nanotube
Source abstract
Abstract
Nanoimpacts of single palladium-coated carbon nanotubes on a gold substrate are studied to elucidate the origins of the fluctuation in the current-time response of the hydrogen oxidation reaction mediated at its surface. The chronoamperometric and cyclic voltammetric responses from a single nanotube immobilized on the gold surface were compared to analogous data on a carbon substrate to determine the possible influence of substrate material on the nanotube-electrode electrical contact. No significant distinction between the gold and carbon was found, indicating in light of the considerable differences in the substrate materials' intrinsic electronic structures that it is the nanomotion of a nanotube at the electrode surface which is likely responsible for the observed current modulation. This nanomotion creates a varying contact resistance, to which the noise in the current-time signal of the mediated reaction is attributed. In addition, stochastic ex-situ adsorption of single nanotubes onto the gold electrode followed by careful drying of the electrode surface was found to drastically reduce the current fluctuation, again implying that a contact resistance arising from physical motion of the nanotube at the electrode is responsible for the modulation of current.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Electrochemical Analysis and Applications · Conducting polymers and applications · Electrochemical sensors and biosensors
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Department of Chemistry, Physical and Theoretical Chemistry Laboratory, Oxford University, South Parks Road, Oxford OX1 3QZ, United Kingdom
Shanghai Key Laboratory of Materials Protection and Advanced Materials in Electric Power, Shanghai University of Electric Power, 2103 Pingliang Road, Shanghai 200090, P.R. China
Funding
European Research Council · China Scholarship Council · National Natural Science Foundation of China
References (37)
Show source-provided references
1. 10.1002/anie.20150901710.1002/anie.201509017 ↗
2. 10.1002/tcr.20110002710.1002/tcr.201100027 ↗
3. 10.1021/acs.chemrev.5b0032410.1021/acs.chemrev.5b00324 ↗
4. 10.1021/nn503831r10.1021/nn503831r ↗
5. 10.1016/j.elecom.2014.03.01810.1016/j.elecom.2014.03.018 ↗
6. 10.1016/j.trac.2014.01.00810.1016/j.trac.2014.01.008 ↗
7. 10.1002/anie.20110088510.1002/anie.201100885 ↗
8. 10.1021/ja106054c10.1021/ja106054c ↗
9. 10.1021/jp904811f10.1021/jp904811f ↗
10. 10.1016/j.snb.2014.01.04010.1016/j.snb.2014.01.040 ↗
11. 10.1021/ja072344w10.1021/ja072344w ↗
12. 10.1021/la00011a02210.1021/la00011a022 ↗
13. 10.1016/j.cplett.2012.02.03110.1016/j.cplett.2012.02.031 ↗
14. 10.1021/ja503314u10.1021/ja503314u ↗
15. 10.1021/jacs.5b1165510.1021/jacs.5b11655 ↗
16. 10.1021/jp062141e10.1021/jp062141e ↗
17. 10.1021/ja310614x10.1021/ja310614x ↗
18. 10.1021/nn500045m10.1021/nn500045m ↗
19. 10.1021/la402818g10.1021/la402818g ↗
20. 10.1002/celc.20140240110.1002/celc.201402401 ↗
21. 10.1063/1.170268210.1063/1.1702682 ↗
22. Sharvin Y. V. · Sov. Phys. JETP · 1965 · 21 · 655
23. Holm, R.; Holm, E.Electric Contacts: Theory and Application,4th ed.Springer-Verlag:Berlin/Heidelberg/New York, 1967; pp1–55.10.1007/978-3-662-06688-1_1 ↗
24. 10.1016/j.nantod.2012.04.00510.1016/j.nantod.2012.04.005 ↗
25. 10.1021/ja400091710.1021/ja4000917 ↗
26. 10.1016/j.electacta.2009.03.02110.1016/j.electacta.2009.03.021 ↗
27. 10.1021/ac502946q10.1021/ac502946q ↗
28. 1974
29. 10.1103/PhysRev.71.62210.1103/PhysRev.71.622 ↗
30. 10.1103/PhysRev.90.18710.1103/PhysRev.90.187 ↗
31. 10.1002/cphc.20150040410.1002/cphc.201500404 ↗
32. 10.1016/j.snb.2014.03.08510.1016/j.snb.2014.03.085 ↗
33. 10.1016/S0022-0728(98)00448-310.1016/S0022-0728(98)00448-3 ↗
34. 10.1021/acs.jpcc.5b0186410.1021/acs.jpcc.5b01864 ↗
35. 10.1088/0957-4484/21/33/33570210.1088/0957-4484/21/33/335702 ↗
36. 10.1002/cphc.20130119710.1002/cphc.201301197 ↗
37. 10.1021/jp504968j10.1021/jp504968j ↗