Role of Hydrogen-Related Defects in Photocatalytic Activity of ZnO Films Grown by Atomic Layer Deposition

The photocatalytic activity of ZnO films, grown by atomic layer deposition on sapphire, was investigated for different amounts of residual hydrogen incorporated unintentionally into the matrix during the crystal growth. A close correlation was found between the level of incorporated hydrogen and the rate of photocatalytic degradation of methylene blue on ZnO films. The rate of degradation is consistent with predominantly zero-order reaction kinetics. An enhanced photocatalytic activity, observed for films of predominantly (001)-oriented grains and low concentration of residual hydrogen, is explained by the reduced number of hydrogen-related defects responsible for recombination of charge carriers in combination with the preferential adsorption of water on polar (001) surfaces of ZnO grains.