Nitrided Zeolites: A Spectroscopic Approach for the Identification and Quantification of Incorporated Nitrogen Species

The combination of X-ray photoelectron spectroscopy (XPS) and diffuse reflectance infrared Fourier transform spectroscopy (DRIFTS) allowed a clear identification and quantification of nitrogenous species incorporated upon nitridation in three different zeolites one Y zeolite (Si/Al ratio of 2.6) and two ultrastable Y zeolites (Si/Al ratios of 13 and 37). Both the amount and the chemical nature of incorporated nitrogen species were controlled by the nitridation temperature. Namely, an increase of the temperature induces an increase of the nitrogen content and the appearance of nitrogenous species in the following order of increasing temperature: NH 4 +, adsorbed NH 3, −NH 2, >NH, and >N−. Based on these spectroscopic results, a mechanism of nitridation in function of temperature was proposed, this mechanism being independent of the properties of the parent zeolite. We evidenced here that the replacement of hydroxyls groups located in the microposity of the zeolite by nitrogen species was effective which can be very motivating result for the application of these materials as shape selective catalysts.